Abstract:Low threshold coherent emission at 1.5 µm is achieved using Er3+-doped dielectric 1D microcavities fabricated with a Radio Frequency-sputtering technique. The microcavities are composed of a half-wavelength Er3+-doped SiO2 active layer inserted between two Bragg reflectors consisting of ten, five, and seven pairs of SiO2/TiO2 layers, also doped with Er3+ ions. The morphology of the structure is inspected using scanning electron microscopy. Transmission measurements show the third and first order cavity resonan… Show more
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