2008
DOI: 10.1149/1.2982902
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Low Temperature Wafer Bonding

Abstract: Low temperature wafer bonding is requested in many applications. Most of them involve silicon or silicon dioxide bonding interfaces. Studying bonding process / mechanism in the low temperature range (<400oC) is therefore very important. But depending on the oxide thickness involved, bonding behaviors are different. In this paper, a quick overview presents the state of the art in silicon oxide or silicon bonding progress mainly focused on the bonding energy and defectivity with only low thermal treatment use… Show more

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Cited by 19 publications
(10 citation statements)
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“…The samples are expected to relax when their elastic energy, divided by the area in contact with the substrate, exceeds a certain threshold. From our set of samples, we estimate this elastic energy threshold to be at around 3 J/m² which is in the same order of magnitude compared to the bonding energies measured from wafer bonding experiments [28]- [30]. We hypothesize that further thermal annealing could increase this elastic energy threshold.…”
Section: Figure 2: (A) Design Parameter Used To Tune the Strain In Thsupporting
confidence: 57%
“…The samples are expected to relax when their elastic energy, divided by the area in contact with the substrate, exceeds a certain threshold. From our set of samples, we estimate this elastic energy threshold to be at around 3 J/m² which is in the same order of magnitude compared to the bonding energies measured from wafer bonding experiments [28]- [30]. We hypothesize that further thermal annealing could increase this elastic energy threshold.…”
Section: Figure 2: (A) Design Parameter Used To Tune the Strain In Thsupporting
confidence: 57%
“…This hydrogen is trapped at the bonding interface, which generates bubbles. 10 One interesting application of the DEAE bonding energy enhancement at very low temperature is to reduce this well-known Si/Si hydrophilic bonding defectiveness. With scanning acoustic microscopy (SAM), we can see in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Direct bonding is used in this work to bond layer A1 with layer A2. It is known that the quality of Si-Si direct bonding is enhanced using a SiO 2 thin layer on the bonding interface (greater than 50 nm) [31]. The SiO 2 layer dissolves hydrogen generated at the annealing step avoiding voids and bubbles at the bond interface.…”
Section: Si-si Direct Bonding With Patterned Featuresmentioning
confidence: 99%