2015
DOI: 10.1016/j.jcrysgro.2014.10.043
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Low-temperature MOVPE using TEGa for suppressed layer undulation in InxGa1−xAs/GaAs1−yPy superlattice on vicinal substrates

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Cited by 15 publications
(11 citation statements)
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References 31 publications
(31 reference statements)
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“…This finding supports the previously proposed mechanism that layer undulation is caused by step bunching that normally occurs over plural steps. Indeed, it was observed that the lateral periodicity of layer undulation was strongly dependent on growth temperature : Higher growth temperature induced larger lateral periodicity in the undulated layers, and no undulation was found in low‐temperature growth.…”
Section: Resultsmentioning
confidence: 99%
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“…This finding supports the previously proposed mechanism that layer undulation is caused by step bunching that normally occurs over plural steps. Indeed, it was observed that the lateral periodicity of layer undulation was strongly dependent on growth temperature : Higher growth temperature induced larger lateral periodicity in the undulated layers, and no undulation was found in low‐temperature growth.…”
Section: Resultsmentioning
confidence: 99%
“…The top p‐region and the bottom n‐region were grown using TMGa at 610 °C, and the i‐region including the superlattice was grown using TEGa at 530 °C. As mentioned previously, the low‐temperature growth of the superlattice using TEGa on a 6 ° off substrate was required to suppress excessive layer undulation and resultant degradation in the quality of the stacked layers .…”
Section: Methodsmentioning
confidence: 99%
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“…В последнее время большой интерес вызывают наноструктуры, обладающие свойствами, промежуточными между свойствами КЯ и КТ [11][12][13][14][15]. Они вносят сравнимый с КЯ вклад в фототок, и при их формировании, как и в случае КТ, происходит бездефектная релаксация упругих напряжений.…”
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