“…13,[19][20][21][22] The most direct solution to the problems involved in performing AFM microscopy above ambient temperatures is to change the ambient temperature ͑i.e., to place the microscope in an insulated box͒ and then operate the microscope at the desired temperature after thermal equilibrium has been established. This method has successfully been applied by several groups 19,20,22 to samples studied by AFM at temperatures from 6 K up to room temperature, but has so far been unsatisfactory when studying samples above room temperature. 5,20,23 Among other reasons, this may be due to the fact that the loading forces vary due to thermally induced cantilever drift.…”