2011
DOI: 10.1021/cm202475e
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Low Temperature Growth of High Purity, Low Resistivity Copper Films by Atomic Layer Deposition

Abstract: The atomic layer deposition of copper metal thin films was achieved using a three precursor sequence entailing Cu(OCHMeCH2NMe2)2, formic acid, and hydrazine. A constant growth rate of 0.47−0.50 Å/cycle was observed at growth temperatures between 100 and 170 °C. The resulting films are high purity and have low resistivities.

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Cited by 71 publications
(88 citation statements)
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“…31 To investigate the mechanism, we suppose that hydrazine dissociates into an NH 2 radical in the proximity of an adsorbed formate anion. (We have identified various routes towards the production of reactive NH 2 , but have not calculated the activation energies that could reveal which route predominates, or whether side-reactions prevent NH 2 forming at all.)…”
Section: Figmentioning
confidence: 99%
“…31 To investigate the mechanism, we suppose that hydrazine dissociates into an NH 2 radical in the proximity of an adsorbed formate anion. (We have identified various routes towards the production of reactive NH 2 , but have not calculated the activation energies that could reveal which route predominates, or whether side-reactions prevent NH 2 forming at all.)…”
Section: Figmentioning
confidence: 99%
“…6 Kalutarage et al compared twostep and three-step processes using the ALD reaction of Cu(dmap) 2 with BH 3 (NHMe 2 ) and separately with BH 3 (NHMe 2 ) and HCO 2 H. 9 They showed that the two-step process requires a Cu seed layer, and affords a growth rate of about 0.13 Å/cycle within the 130−160 °C ALD window.…”
Section: Introductionmentioning
confidence: 99%
“…12 Later, a thin film of very pure Cu has been deposited using a three-step ALD process which entails the sequential reactions of Cu(dmap) 2 , formic acid and hydrazine (N 2 H 4 ) at 120 °C. 6 Recently, low temperature Cu ALD has also been demonstrated using a two-step process of Cu(dmap) 2 and borane dimethylamine [BH 3 (NHMe 2 )]…”
Section: Introductionmentioning
confidence: 99%