2005
DOI: 10.1063/1.2112181
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Low-temperature growth and interface characterization of BiFeO3 thin films with reduced leakage current

Abstract: BiFeO 3 (BFO) thin films of pure perovskite phase were deposited on LaNiO3-buffered Pt∕TiOx∕SiO2∕Si (LNO) and Pt∕TiOx∕SiO2∕Si (Pt) substrates by RF magnetron sputtering. Highly (100)-oriented BFO film was coherently grown on LNO at a temperature as low as 300 °C. The crystal structure and the film/electrode interface of BFO films were characterized using x-ray diffraction and scanning transmission electron microscope high-angle annular dark-field imaging. The conventional problem of the leakage current was gre… Show more

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Cited by 153 publications
(106 citation statements)
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“…It is possible to destroy the spin cycloid and hence to release the non-zero macroscopic M r and potential magnetoelectric effect. It has been demonstrated that A site substituted BFO multiferroics accompany their non-zero macroscopic M r with destroyed spin cycloids (Wang et al 2005(Wang et al , 2006Lee et al 2005;Eerenstein et al 2005).…”
Section: Introductionmentioning
confidence: 99%
“…It is possible to destroy the spin cycloid and hence to release the non-zero macroscopic M r and potential magnetoelectric effect. It has been demonstrated that A site substituted BFO multiferroics accompany their non-zero macroscopic M r with destroyed spin cycloids (Wang et al 2005(Wang et al , 2006Lee et al 2005;Eerenstein et al 2005).…”
Section: Introductionmentioning
confidence: 99%
“…Since then more studies have reported with successful development of BFO thin films with polarizations ranging from 50 to 150 m/cm 2 . 2, [8][9][10] Theoretical work has also been conducted to interpret the extraordinarily large ferroelectric polarization in BFO films. 11 The success in the thin film studies has in turn stimulated interest to produce bulk ceramics with improved properties.…”
mentioning
confidence: 99%
“…In fact, the hybridization of Ti O orbitals supports the dislocation of the Ti 4+ ion in the (100) direction. In addition, hysteresis loop BFO slightly shift to the positive bias eld, which could be attributed to crystallographic defect distribution, and thermal history between top electrode and bottom electrodes [25].…”
Section: Resultsmentioning
confidence: 99%