2018
DOI: 10.1016/j.apsusc.2018.07.210
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Low-temperature direct synthesis of high quality WS2 thin films by plasma-enhanced atomic layer deposition for energy related applications

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Cited by 44 publications
(44 citation statements)
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“…WF6 does not enable film growth with H2S unless a H2 plasma pulse [43][44][45][46] is added before the H2S pulse or either a ZnS substrate or a ZnEt2 pulse [47][48][49] is applied. W(CO)6 can be used to deposit amorphous or nanocrystalline WS2 films with either H2S 50,51 or H2S plasma 52 reactants. The use of WCl5 with H2S has also been claimed, but very limited information is available about the precursor as well as the process and its ALD characteristics.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…WF6 does not enable film growth with H2S unless a H2 plasma pulse [43][44][45][46] is added before the H2S pulse or either a ZnS substrate or a ZnEt2 pulse [47][48][49] is applied. W(CO)6 can be used to deposit amorphous or nanocrystalline WS2 films with either H2S 50,51 or H2S plasma 52 reactants. The use of WCl5 with H2S has also been claimed, but very limited information is available about the precursor as well as the process and its ALD characteristics.…”
Section: Introductionmentioning
confidence: 99%
“…The use of WCl5 with H2S has also been claimed, but very limited information is available about the precursor as well as the process and its ALD characteristics. 53 Furthermore, in many cases the ALD WS2 films have been tens to hundreds of nm in thicknessindeed, in addition to the WCl5+H2S process, ultrathin (<10 nm) films have only been deposited by the W(CO)6+H2S plasma 52 and WF6+H2 plasma+H2S [43][44][45][46] PEALD processes operated at 350 and 250-450 °C, respectively.…”
Section: Introductionmentioning
confidence: 99%
“…It could be observed from Figure a that the two characteristic peaks near 31.8 eV and 34.0 eV were attributed to W4f 7/2 and W4f 5/2 , respectively; the two peaks at 33.3 eV and 35.3 eV were derived from W 4f 7/2 and W4f 5/2 of W−O bond due to surface oxidation of the sample; the wide peak at 37.6 eV was belong to XPS spectrum of W5p. Figure b showed that the XPS spectra of S 2p 3/2 and S 2p 1/2 , and the two characteristic peaks were located at 161.5 eV and 162.8 eV, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Yeo et al [62] deposited a 1-cm-scale few-layer WS 2 on Si/SiO 2 using an organic tungsten precursor at 350 • C, with layer number varying with pulse number as with MoS 2 . Other efforts have been made to deposit tungsten precursor directly on Si/SiO 2 via ALD and then sulfurize to grow WS 2 , but we deem these efforts to fall outside the scope of true ALD growths because of the lack of sequential pulsing.…”
Section: Atomic Layer Deposition (Ald)mentioning
confidence: 99%