2006
DOI: 10.1016/j.tsf.2005.07.217
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Low temperature amorphous and nanocrystalline silicon thin film transistors deposited by Hot-Wire CVD on glass substrate

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Cited by 24 publications
(12 citation statements)
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“…Hydrogenated nanocrystalline silicon (nc-Si:H)-based devices have been reported to be more stable than their amorphous (a-Si:H) counterparts. 7 Klein et al 8 have recently shown that microcrystalline silicon films grown at a high deposition rate could be obtained at a high deposition pressure, but the material quality decreased. In this study, good-quality intrinsic nanocrystalline silicon films have been deposited using the increase of the deposition pressure at deposition rates as high as 4.7 s -1 .…”
Section: Introductionmentioning
confidence: 99%
“…Hydrogenated nanocrystalline silicon (nc-Si:H)-based devices have been reported to be more stable than their amorphous (a-Si:H) counterparts. 7 Klein et al 8 have recently shown that microcrystalline silicon films grown at a high deposition rate could be obtained at a high deposition pressure, but the material quality decreased. In this study, good-quality intrinsic nanocrystalline silicon films have been deposited using the increase of the deposition pressure at deposition rates as high as 4.7 s -1 .…”
Section: Introductionmentioning
confidence: 99%
“…Thus far, high field effect mobility has only been achieved in TFTs with SiO 2 , not a-SiN x :H. Reported mobilities are in the range of 11−150 cm 2 /(V . s) 4,6,[8][9][10][11] and 0.5−2 cm 2 /(V . s) 5,7,12 for SiO 2 and a-SiN x :H gate dielectrics, respectively.…”
Section: Tft Structure and Fabricationmentioning
confidence: 98%
“…Thus far, high field effect mobility has only been achieved in TFTs with SiO 2 , not a-SiN x :H. Reported mobilities are in the range of 11−150 cm 2 /(V . s) 4,6,[8][9][10][11] and 0.5−2 cm 2 /(V . s) 5 poly-Si and crystalline silicon transistors, too.…”
Section: Substratementioning
confidence: 98%