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Traditional optical communication systems rely on single narrow-band PDs, which can expose confidential information and data to potential eavesdropping in free space. With advancements in technology, even optical communication in the UV spectrum, invisible to the sun, faces risks of interception. Consequently, broad-band PDs that combine optical encryption with algorithmic encryption hold significant promise for secure and reliable communication. This study presents a photodetector based on TiO2–α-Ga2O3 heterostructures, prepared via direct oxidation and hydrothermal reaction, demonstrating self-powered UVC/UVA broad-band detection capabilities. The PD exhibits response peaks at approximately 250 and 320 nm, with R of 42.16 and 59.88 mA/W and D* of 8.21 × 1013 and 9.56 × 1013 Jones, respectively. Leveraging the superior optical response characteristics of UVC and UVA wavelengths, this device has been employed to develop a communication system designed for data transmission. The proposed system features two independent channels: one for data transmission using UVC and another for key distribution using UVA. Secure communication is ensured through specialized encryption algorithms. In summary, this work offers a straightforward, cost-effective, and practical method for fabricating self-powered UVC/UVA broad-band PDs. This PD provides new insights into the development of multi-purpose, multi-band secure optical communication devices and holds promise for integration into multifunctional optoelectronic systems in the future.
Traditional optical communication systems rely on single narrow-band PDs, which can expose confidential information and data to potential eavesdropping in free space. With advancements in technology, even optical communication in the UV spectrum, invisible to the sun, faces risks of interception. Consequently, broad-band PDs that combine optical encryption with algorithmic encryption hold significant promise for secure and reliable communication. This study presents a photodetector based on TiO2–α-Ga2O3 heterostructures, prepared via direct oxidation and hydrothermal reaction, demonstrating self-powered UVC/UVA broad-band detection capabilities. The PD exhibits response peaks at approximately 250 and 320 nm, with R of 42.16 and 59.88 mA/W and D* of 8.21 × 1013 and 9.56 × 1013 Jones, respectively. Leveraging the superior optical response characteristics of UVC and UVA wavelengths, this device has been employed to develop a communication system designed for data transmission. The proposed system features two independent channels: one for data transmission using UVC and another for key distribution using UVA. Secure communication is ensured through specialized encryption algorithms. In summary, this work offers a straightforward, cost-effective, and practical method for fabricating self-powered UVC/UVA broad-band PDs. This PD provides new insights into the development of multi-purpose, multi-band secure optical communication devices and holds promise for integration into multifunctional optoelectronic systems in the future.
AlGaN-based LEDs are promising for many applications in deep ultraviolet fields, especially for water-purification projects, air sterilization, fluorescence sensing, etc. However, in order to realize these potentials, it is critical to understand the factors that influence the optical and electrical properties of the device. In this work, AlxGa1−xN (x = 0.24, 0.34, 0.47) epilayers grown on c-plane patterned sapphire substrate with GaN template by the metal organic chemical vapor deposition (MOCVD). It is demonstrated that the increase of the aluminum content leads to the deterioration of the surface morphology and crystal quality of the AlGaN epitaxial layer. The dislocation densities of AlxGa1−xN epilayers were determined from symmetric and asymmetric planes of the ω-scan rocking curve and the minimum value is 1.01 × 109 cm−2. The (101¯5) plane reciprocal space mapping was employed to measure the in-plane strain of the AlxGa1−xN layers grown on GaN. The surface barrier heights of the AlxGa1−xN samples derived from XPS are 1.57, 1.65, and 1.75 eV, respectively. The results of the bandgap obtained by PL spectroscopy are in good accordance with those of XRD. The Hall mobility and sheet electron concentration of the samples are successfully determined by preparing simple indium sphere electrodes.
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