2008
DOI: 10.1063/1.2921830
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Low saturation fluence in a semiconductor saturable electroabsorber mirror operated in a self-biased regime

Abstract: This is a repository copy of Low saturation fluence in a semiconductor saturable electroabsorber mirror operated in a self-biased regime. ReuseUnless indicated otherwise, fulltext items are protected by copyright with all rights reserved. The copyright exception in section 29 of the Copyright, Designs and Patents Act 1988 allows the making of a single copy solely for the purpose of non-commercial research or private study within the limits of fair dealing. The publisher or other rights-holder may allow furthe… Show more

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Cited by 2 publications
(22 citation statements)
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“…The alternative mechanism of absorption saturation is the electroabsorptive mechanism which acts via a combination of electroabsorption effect and field screening by photogenerated carriers. In a recent paper [7], we have shown that the electroabsorption effect in extremely shallow QWs (ESQWs) [8,9] is well suited for implementation of very low saturation fluence self-biased surface-normal electroabsorptive SESAMs.…”
Section: Introductionmentioning
confidence: 99%
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“…The alternative mechanism of absorption saturation is the electroabsorptive mechanism which acts via a combination of electroabsorption effect and field screening by photogenerated carriers. In a recent paper [7], we have shown that the electroabsorption effect in extremely shallow QWs (ESQWs) [8,9] is well suited for implementation of very low saturation fluence self-biased surface-normal electroabsorptive SESAMs.…”
Section: Introductionmentioning
confidence: 99%
“…Here, we generalize the treatment of Franz-Keldysh effect in self-biased heterostructures conducted in [7] to analyze both bulk and ESQW structures and also to include resonator effects and to show how the device performance can be optimized using these routes. We also analyze the thermal properties of the SESAM and compare them to those of existing constructions.…”
Section: Introductionmentioning
confidence: 99%
“…2b) are the calculated transmittance T ¼ P t /P in (P t being the transmitted power) and absorptance A ¼ 1-R-T of the SESAM against incident pulse energy. Note that, in the present study, the reflectance R saturates at a value of R ¼ 0.9, rather than R ¼ 1 as in [6,7] This is because with R DBR ¼ 0.97, approximately 0.1 of the incident power is transmitted through the DBR into the substrate, as illustrated by the (theoretical) curves in Fig. 2b.…”
mentioning
confidence: 85%
“…As the peak laser power incident on the SBSESAM was only 1 mW, the laser was emitting optical pulses t p ' 200 ns long in order to accumulate the energy necessary to saturate the SESAM. Owing to the deliberately large load resistance (R L 200 kV), the discharge of the P -i-N structure capacitance through R L during the pulse was negligible despite the long t p , and the SESAM was operating in the t p R L C regime analysed in [6,7]. In this regime, the reflectance R ¼ P r /P in (P r and P in being the reflected and incident power) is determined at the end of the optical pulse.…”
mentioning
confidence: 99%
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