2014
DOI: 10.1007/s40820-014-0016-2
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Low-Programmable-Voltage Nonvolatile Memory Devices Based on Omega-shaped Gate Organic Ferroelectric P(VDF-TrFE) Field Effect Transistors Using p-type Silicon Nanowire Channels

Abstract: A facile approach was demonstrated for fabricating high-performance nonvolatile memory devices based on ferroelectric-gate field effect transistors using a p-type Si nanowire coated with omega-shaped gate organic ferroelectric poly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)). We overcame the interfacial layer problem by incorporating P(VDF-TrFE) as a ferroelectric gate using a low-temperature fabrication process. Our memory devices exhibited excellent memory characteristics with a low programming volt… Show more

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Cited by 21 publications
(8 citation statements)
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“…c) Reproduced with permission . Copyright 2014, American Chemical Society d,e,f) Reproduced with permission . Copyright 2014, Springer.…”
Section: Properties and Applicationsmentioning
confidence: 99%
See 1 more Smart Citation
“…c) Reproduced with permission . Copyright 2014, American Chemical Society d,e,f) Reproduced with permission . Copyright 2014, Springer.…”
Section: Properties and Applicationsmentioning
confidence: 99%
“…A new nonvolatile memory device based on FeFETs was recently fabricated using a p‐type Si NW coated with omega‐shaped gate organic ferroelectric PVDF‐TrFE . Excitingly, this memory device exhibited excellent memory characteristics, a low programming voltage level of ±5 V, a high channel conductance modulation between the ON and OFF states exceeding 10 5 , long retention times exceeding 3 × 10 4 s, and high endurance over 10 5 programming cycles while maintaining an I ON / I OFF ratio higher than 10 2 (Figure d–f).…”
Section: Properties and Applicationsmentioning
confidence: 99%
“… A comparison between single SiNW-FETs [ 11 , 33 , 175 , 181 , 182 , 183 , 184 , 185 , 186 , 187 , 188 , 189 , 190 ] and SiNN-FETs with respect to the channel length (SiNN density is about 0.6 NWs μm −2 ). Squares of SiNN-FETs segment show the average of several devices’ performances in which bars are representative of deviation in measured parameters for a certain L c .…”
Section: Figurementioning
confidence: 99%
“…P s of CA crystals can even achieve 30 µC cm −2 . [ 11 ] These attributes are very promising for low‐power electronics including nonvolatile memories, [ 10e,12 ] yet the highly crystalline large‐area continuous thin film/device fabrication of CA [ 13 ] and DIPAB [ 14 ] is a challenging task. Obtaining the ferroelectric properties of polycrystalline films prepared by conventional techniques such as thermal evaporation [ 15 ] is a difficult task, since their randomly distributed polar axes in the unipolar crystallites can significantly suppress remnant polarization ( P r ) with large depolarization fields, which may lead to the failure of ferroelectric switching.…”
Section: Figurementioning
confidence: 99%