Abstract:Scan design causes high switching activity during testing which results in high power dissipation. Therefore, an alternative scheme, termed Random Access Scan (RAS, initially proposed by Ando during the early 80's) has regained interest due to its low power consumption. RASbased schemes result in considerable reduction in power dissipation; furthermore they have been shown to compare favorably to scan based schemes with respect to hardware overhead. Response compaction in RAS architectures is typically perform… Show more
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