Low-noise CMOS differential-amplifier design using automated-design methodology

Singh, Chabungbam Lison; Gogoi, Ashim Jyoti; Anandini, Chabungbam; Baishnab, Krishna Lal

doi:10.1109/devic.2017.8073962

Cited by 5 publications

(2 citation statements)

References 13 publications

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“…A change in the W and L of MOS transistors has a significant impact on the transistor specification parameters (i.e. the threshold voltage or channel length modulation parameter) [22], [23], which has affects the functional parameters of a Dickson charge pump.…”

Section: B Technological Process Imperfectnessmentioning

confidence: 99%

Design an Identification Function to Reduce the Computational Resources on the Testing Process of an Analog Electronic Circuit

Temich¹,

Golonek²,

Grzechca³

2019

ElAEE

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In modern electronic circuits, imperfectness in the technological process can cause errors in reaching the correct values of the functional parameters. In order to solve this problem, a novel approach of analog and mixed-signal circuit testing methodology is used. The presented approach allows the testing complexity to be reduced and the testing time to be decreased. For this paper, selected signal features were designated from the transient output signal response. Using regression models with the extracted signal features, the functional parameters of a circuit were determined. An evolutionary determination of the regression models enabled the efficiency of the identification process to be maximized. The proposed methodology is presented for an exemplary CMOS Dickson charge pump circuit.

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Section: B Technological Process Imperfectnessmentioning

confidence: 99%

Design an Identification Function to Reduce the Computational Resources on the Testing Process of an Analog Electronic Circuit

Temich¹,

Golonek²,

Grzechca³

2019

ElAEE

View full text Add to dashboard Cite

show abstract

“…Transistors can be parametrically damaged in many different ways during technological processes. The most frequent parametric damage at the production stage is a deviation of the photolithographic mask [23]- [24]. This kind of error affects the parametric values of the transistor structurethe width (W) and length (L) of a channel.…”

Section: Production Imperfectnessmentioning

confidence: 99%

Identification of the Specification Parameters for a Voltage Controlled Oscillator Using an Artificial Neural Network with a Genetic Algorithm

Temich¹,

Chruszczyk²,

Grzechca³

2018

ElAEE

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This paper presents the application of an artificial neural network with a genetic algorithm for identifying the selected specification parameters of a voltagecontrolled oscillator (VCO). In modern electronics, the complexity of the production process may cause errors in analogue and mixed-signal electronic circuits, and inaccuracies in this technological process have a direct impact on the specification parameters of a VCO. The modern market requires that the production process has to be as quick as possible, and therefore testing systems should be fast and have the highest efficiency of parameter identification. In the following paper, a genetic algorithm is used to optimise the number of output signal measurement points, which allows them to be identified by the specification parameters of the VCO that are selected by an artificial neural network. The proposed method is characterised by shortening the test time of the system while maintaining a high efficiency in the identification of the selected design specification parameters.

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Design of Differential Amplifier Using Current Mirror Load in 90 nm CMOS Technology

Das

Saw

Meher

2018

Advances in Intelligent Systems and Computing

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Low-noise CMOS differential-amplifier design using automated-design methodology

Cited by 5 publications

References 13 publications

Design an Identification Function to Reduce the Computational Resources on the Testing Process of an Analog Electronic Circuit

Design an Identification Function to Reduce the Computational Resources on the Testing Process of an Analog Electronic Circuit

Identification of the Specification Parameters for a Voltage Controlled Oscillator Using an Artificial Neural Network with a Genetic Algorithm

Design of Differential Amplifier Using Current Mirror Load in 90 nm CMOS Technology

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