Optical Components and Materials XX 2023
DOI: 10.1117/12.2651669
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Low-noise AlGaAsSb avalanche photodiodes for 1550 nm light detection

Abstract: The optical detector used in pulsed LIDAR, range finding and optical time domain reflectometry systems is typically the limiting factor in the system's sensitivity. It is well-known that an avalanche photodiode (APD) can be used to improve the signal to noise ratio over a PIN detector, however, APDs operating at the eye-safe wavelengths around 1550 nm are limited in sensitivity by high excess noise. The underlying issue is that the impact ionization coefficient of InAlAs and InP used as the avalanche region in… Show more

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Cited by 5 publications
(7 citation statements)
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“…Avalanche gain versus voltage was calculated by setting the gain at punch-through voltage (-30 V) to 1.5 as previously presented in ref. [10]. The unmultiplied responsivity value is 0.95 A/W [10].…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Avalanche gain versus voltage was calculated by setting the gain at punch-through voltage (-30 V) to 1.5 as previously presented in ref. [10]. The unmultiplied responsivity value is 0.95 A/W [10].…”
Section: Methodsmentioning
confidence: 99%
“…AlGaAsSb-based SAM-APD is one of the most promising candidates for high-gain linear mode detection as it has demonstrated extremely high-temperature stability and low excess noise factor at high gain [8], [9]. Phlux Technology has reported an InGaAs/AlGaAsSb APD with a low dark current and excess noise factor which led to a 12 times improvement in sensitivity (noise equivalent power (NEP)) over a state-of-the-art APD when operated at high gain (M ~100) and integrated with a TIA [10]. In this study, we report on the progress in the temperature stability up to 85 ℃ (maximum operating temperature specified for military and civil applications) of our APDs and develop an APD-TIA receiver module for high gain linear mode few photons detection.…”
Section: Introductionmentioning
confidence: 99%
“…The InGaAs/AlGaAsSb APD wafer was grown on a semiinsulating InP substrate using molecular beam epitaxy. The wafers were designed and fabricated into mesa devices (using standard contact lithography and wet chemical etching) by Phlux Technology Ltd [30]. The InGaAs photon absorption layer and the AlGaAsSb avalanche layer are separated by a charge sheet to minimize the electric field and band-to-band tunneling in the InGaAs layer.…”
Section: Methodsmentioning
confidence: 99%
“…Recently, Al0.85Ga0.15As0.56Sb0.44 (AlGaAsSb) has emerged as a superior avalanche material for Linear mode APDs, with experimental reports of highly dissimilar ionization coefficients [28] and low excess noise factor [29] (resulting in very low Noise-Equivalent-Power [30]). Reported values of Cbd for a GaAsSb/AlGaAsSb SAM APD are ~4 mV/K [31], lower than equivalent InGaAs-based APDs with InP (~100 mV.K -1 ) [32] and InAlAs (~20-50 mV.K -1 ) [23][24][25][26] avalanche layers.…”
mentioning
confidence: 99%
“…Al0.85Ga0.15AsSb (hereafter AlGaAsSb) has demonstrated reduced surface dark currents and very low excess noise characteristics 11,12 . By combining AlGaAsSb with either an InGaAs 13,14 or GaAsSb 15,16 absorber, it has achieved very high sensitivity at 1550 nm along with high bandwidth 17 . Lee et al 16 demonstrated that GaAsSb/AlGaAsSb can achieve a high gain of 278 at room temperature with excess noise F<3 at M=60.…”
Section: Introductionmentioning
confidence: 99%