2018
DOI: 10.1109/jstqe.2018.2825880
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Low Loss Atomic Layer Deposited Al2O3 Waveguides for Applications in On-Chip Optical Amplifiers

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Cited by 24 publications
(13 citation statements)
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“…Al 2 O 3 can be deposited using a variety of methods including synthesis by the solgel method [52][53][54][55][56][57], chemical vapor deposition (CVD) [58,59], pulsed laser deposition (PLD) [60][61][62][63][64][65], atomic layer deposition (ALD) [11,27,[66][67][68][69][70][71][72][73] and reactive sputtering [3][4][5][6][7][8][9][10][12][13][14][15][16][20][21][22]26,[29][30][31][32][33][34][35][36][37][38]…”
Section: Deposition Of Optical Quality Al 2 O 3 Layersmentioning
confidence: 99%
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“…Al 2 O 3 can be deposited using a variety of methods including synthesis by the solgel method [52][53][54][55][56][57], chemical vapor deposition (CVD) [58,59], pulsed laser deposition (PLD) [60][61][62][63][64][65], atomic layer deposition (ALD) [11,27,[66][67][68][69][70][71][72][73] and reactive sputtering [3][4][5][6][7][8][9][10][12][13][14][15][16][20][21][22]26,[29][30][31][32][33][34][35][36][37][38]…”
Section: Deposition Of Optical Quality Al 2 O 3 Layersmentioning
confidence: 99%
“…Atomic layer deposition (ALD) is a chemical vapor deposition technique in which alternating gas precursors are flown over the substrate reacting with their surface in a self-terminating way, thereby growing a thin film [11,[68][69][70][71][72][73]. In between gases, a purging step is applied to eliminate any unreacted species before the start of the next cycle.…”
Section: Atomic Layer Deposition Of Optical Quality Al 2 O 3 Layersmentioning
confidence: 99%
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“…Whereas Si and Si 3 N 4 have a low solubility for rare-earth ions [1,2], amorphous Al 2 O 3 can host high concentrations of those ions with moderate quenching of luminescence [3,4]. The ability to host high concentrations of rare-earth ions in combination with the wide transparency window (150-7000 nm) and low propagation loss [5,6], makes amorphous Al 2 O 3 an attractive material for UV, visible, nearand mid-IR on-chip active devices [7][8][9].…”
Section: Introductionmentioning
confidence: 99%