2007
DOI: 10.1016/j.surfcoat.2007.04.046
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Low-k dielectrics on base of silicon carbon nitride films

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Cited by 48 publications
(25 citation statements)
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“…Silicon carbonitride layers have been grown by means of different methods, namely, chemical vapor deposition (CVD) at higher temperatures [17][18][19][20], use of hot filament chemical vapor deposition [21], plasma enhanced chemical vapor deposition (PECVD) [22][23][24][25][26][27][28][29][30], microwave plasma enhanced chemical vapor deposition (PECVD) [31][32][33][34][35], elec tron cyclotron resonance plasma enhanced chemical vapor deposition (PECVD) [11,12], pulsed laser dep osition [4,13], ion beam sputtering [3,36,37], and reactive magnetron sputtering [7,[38][39][40][41][42][43][44].…”
Section: Introductionmentioning
confidence: 99%
“…Silicon carbonitride layers have been grown by means of different methods, namely, chemical vapor deposition (CVD) at higher temperatures [17][18][19][20], use of hot filament chemical vapor deposition [21], plasma enhanced chemical vapor deposition (PECVD) [22][23][24][25][26][27][28][29][30], microwave plasma enhanced chemical vapor deposition (PECVD) [31][32][33][34][35], elec tron cyclotron resonance plasma enhanced chemical vapor deposition (PECVD) [11,12], pulsed laser dep osition [4,13], ion beam sputtering [3,36,37], and reactive magnetron sputtering [7,[38][39][40][41][42][43][44].…”
Section: Introductionmentioning
confidence: 99%
“…It is noteworthy here that the molecular structure of the starting organosilicon compounds affects the chemical and phase composition, as well as the microstructure of the deposited films of silicon carbonitride. The main part of compounds used for preparation of silicon carbonitride belonged to the class of silazanes: hexamethyldisilazane [11,39,[42][43][44][45][46][47][48][49][50][51][52][53][54], hexamethylcyclotrisilazane [55][56][57][58][59], polysilazanes, etc.…”
mentioning
confidence: 99%
“…или с созданными в материале пустотами (порами), заполненными воздухом, диэлектрическая константа которого со-ставляет 1,0 [1][2][3][4].…”
Section: экспериментальная частьunclassified