2002
DOI: 10.1063/1.1482138
|View full text |Cite
|
Sign up to set email alerts
|

Low-frequency dielectric relaxation and ac conduction of SrBi2Ta2O9 thin film grown by pulsed laser deposition

Abstract: Articles you may be interested inDielectric characterization in a broad frequency and temperature range of Sr Bi 2 Nb 2 O 9 thin films grown on Pt electrodes

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

2
29
0

Year Published

2004
2004
2011
2011

Publication Types

Select...
7
1

Relationship

1
7

Authors

Journals

citations
Cited by 86 publications
(31 citation statements)
references
References 19 publications
2
29
0
Order By: Relevance
“…This is due to the high mobility of oxygen vacancies in bismuth-layered perovskites, where they can move easily by an applied electric field resulting in a little space charge effect at low temperatures. Where as at high temperatures, more oxygen defects are activated and they are accumulated at the electrode interfaces and grain boundaries, thus resulting in a strong space-charge relaxation [12,13].…”
Section: Resultsmentioning
confidence: 99%
“…This is due to the high mobility of oxygen vacancies in bismuth-layered perovskites, where they can move easily by an applied electric field resulting in a little space charge effect at low temperatures. Where as at high temperatures, more oxygen defects are activated and they are accumulated at the electrode interfaces and grain boundaries, thus resulting in a strong space-charge relaxation [12,13].…”
Section: Resultsmentioning
confidence: 99%
“…Currently, isotropic perovskite ferroelectrics Pb(Zr,Ti)O 3 (PZT) and Bi-layer structured ferroelectrics (BLSFs), SrBi 2 Nb 2 O 9 (SBN), BiTi 3 O 12 (BIT) and SrBi 2 Ta 2 O 9 (SBT), are known as useful ferroelectric materials [5][6][7][8][9][10][11][12]. For practical ferroelectric random access memory (FRAM) application, it is necessary to develop a new ferroelectric material with a high remanent polarization, high fatigue endurance, low leakage current polarization, low leakage current and low processing temperature [5-8, 13, 14].…”
Section: Introductionmentioning
confidence: 99%
“…However, the BIT is known to suffer from high leakage current, which leads to polarization fatigue and small remanent polarization. For practical FRAM applications, it is still necessary to develop new ferroelectric materials with an high remanent polarization and a low electrical conductivity [1][2][3][4][5][6][7][8][9]. Recently, the effect of ion doping on the ferroelectric and electrical properties in BLSFs was widely studied for the improvement of ferroelectric properties [1][2][3][4][5][9][10][11][12][13][14][15][16].…”
Section: Introductionmentioning
confidence: 99%
“…It is necessary to have high remanent polarization, high fatigue endurance, low leakage current and low processing temperature [1][2][3][4][5][6]. Bi-layer structured ferroelectrics (BLSFs) such as SrBi 2 Nb 2 O 9 (SBN), Bi 4 Ti 3 O 12 (BIT) and SrBi 2 Ta 2 O 9 (SBT) are known as a ferroelectric material [7][8][9][10][11][12][13][14].…”
Section: Introductionmentioning
confidence: 99%