2013
DOI: 10.1038/nnano.2013.144
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Low-frequency 1/f noise in graphene devices

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Cited by 551 publications
(610 citation statements)
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“…[18] This low-frequency 1/f noise is even more pronounced for devices that are scaled down to nanometer dimensions, where the channel current becomes more prone to fluctuations due to, particularly, interface and surface trap states. [63,64] It is the level of these unwanted fluctuations (along with the sensing response S) that determines the ultimate detection limit of GFET biosensors.…”
Section: Electrical Noise Performances Of Graphene Materialsmentioning
confidence: 99%
See 1 more Smart Citation
“…[18] This low-frequency 1/f noise is even more pronounced for devices that are scaled down to nanometer dimensions, where the channel current becomes more prone to fluctuations due to, particularly, interface and surface trap states. [63,64] It is the level of these unwanted fluctuations (along with the sensing response S) that determines the ultimate detection limit of GFET biosensors.…”
Section: Electrical Noise Performances Of Graphene Materialsmentioning
confidence: 99%
“…[5] The uniqueness of graphene among other solid-state materials is that all carbon atoms are located on the surface, making the graphene surface potentially highly sensitive to any changes of its surrounding environment. Along with the excellent electrical properties of graphene, [13,14] i.e., extraordinary high mobility [15,16,17] and low intrinsic electrical noise, [18][19][20][21] graphene-based electronic biosensors demonstrated greater sensitivity than traditional bioassays. [22] Additionally, graphene (at least ideal graphene) has a crystal lattice free of dangling bonds and is therefore intrinsically chemically inert.…”
Section: Introduction: Challenges and Opportunitiesmentioning
confidence: 99%
“…The measurements were performed in the temperature range from 300 K to 430 K in order to elucidate the physical mechanism of the low-frequency noise and determine the noise activation energies. The low-frequency noise is a ubiquitous phenomenon present in all kinds of electronic devices including field-effect transistors, diodes and interconnects [19][20][21]. The frequency dependence and temperature characteristics of the spectral density of the low-frequency noise have been used as reliability metrics for interconnects in Si complementary metal-oxide-semiconductor (CMOS) technology.…”
Section: Introductionmentioning
confidence: 99%
“…In fact, evaluating C 1Hz is a common approach to compare the noise among different nanopore devices. [25] At frequencies below 1 kHz, a wide variety of nanoscale devices exhibit flicker noise, [39] characterized by PSDs exponentially decaying with the frequency:…”
Section: Bionanotechnologymentioning
confidence: 99%