Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling

Ramana, C. V.; Choi, Bum Sik; Smith, Richard J.

doi:10.1016/s0169-4332(03)00518-x

Cited by 4 publications

(3 citation statements)

References 22 publications

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“…For channeling measurements the sample was aligned with the ion beam incident along the ½0 0 1 direction by minimizing the backscattered ion yield in a small region behind the surface peak. Low-energy ion scattering and high-energy ion channeling measurements were made in separate experiments because of the tendency for He + ions implanted during LEIS to interfere with the channeling of high-energy He + ions [29]. A total dose of 3 · 10 14 ions/cm 2 was used to collect each channeling spectrum.…”

Section: Methodsmentioning

confidence: 99%

Thermal and chemical stability of epitaxial Fe films grown on the Ti-stabilized Al(100) surface

et al. 2008

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Section: Methodsmentioning

confidence: 99%

Thermal and chemical stability of epitaxial Fe films grown on the Ti-stabilized Al(100) surface

et al. 2008

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“…Analysis of the Al surface peak area for channeled MeV He ions, as well as the dechanneling yield from well below the surface, indicated an unusual increase in the depth distribution of the backscattered ion yield from Al with increasing low-energy He ion dose (Ramana et al, 2003).…”

Section: Introductionmentioning

confidence: 99%

“…A considerable amount of data can be found in literature related to studies on charge fractions after collisions of atomic projectiles with solid targets. Early work on this problem was concentrated on the analysis of charge state distributions after the transmission of fast ions through thin solid foils or through targets with atoms in the gas phase over a wide domain of projectile velocities (Garnir et al, 1996;Grande & Schiwietz, 1998;Perumal, 2005), whereas such data for scattering experiments from surfaces of solid targets are rather rare Ramana et al, 2003;Yang and Jory, 2003;Nakajima et al, 2004). In recent years, however, the impact of atomic projectiles on the surface of solid targets has been paid increased attention, and measurements of charge fractions for energetic projectiles provided the basis for a microscopic understanding of the atom-surface interaction scenario (Kimura et al, 1992;Winter et al, 1998, Wethekam et al, 2003.…”

Section: Introductionmentioning

confidence: 99%

Theoretical Interpretation of Atomic Charge Exchange between Singly Charged Helium Ions and Aluminum Foils

Mahasneh¹

2010

MAS

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An experimental method for determining the equilibrium charge state of fast helium ions backscattered by solid Al-foils has been conducted using single Silicon Surface Barrier Detector (SBD) in a post acceleration system (PAS). The charge state measurements have been conducted to cover a wide energy range of the incident singly charged helium ion He + . The detected charge states increases from 0 to +Z with the incident ion's velocity. The method consists of measuring the charge states of ions after backscattering from the Al-foil as a function of projectile velocity and also finding the charge state distributions as a function of Al-foil thickness. The measurements are conducted for two types of Al-foil, one of which is thinner (2.5, 4.0, 5.4 μg/cm 2 ) and the other of which is of the order of an equilibrium foil thickness, where thicknesses of 6.8, 8.1, 9.5, and 10.8 were used. Ratios of equilibrium charge state yields for singly to doubly ionized He ions; He +1 and He +2, were also measured. The kinematics behavior of the measured He 0 , He + and He +2 fractions is understood by the well-known Rutherford Backscattering Spectrometry technique (RBS). It has been shown that the dominant processes occurring to a fast He + ions traversing Al-foil are the capture of the electron from the Al-atom to vacant state in the ion and the stripping of the bound electron from the He + ion. The charge composition of the ion beams changes when it backscatters Al-foil, which thick enough for multiple atomic collisions, leading eventually to an equilibrium charge state distribution (ECSD). It was found that the theoretical calculations for electron-capture and loss ratios, based of semi-classical approach of Bianconi, are successful in describing the measured He ions. The satisfactory fits of the measured equilibrium charge state fractions (ECSF's) are mainly accounted to the contribution of both free valance electrons of the target and screened target nucleus in the calculation of total electron-loss cross sections. Bianconi approach is also applied to describe the measured mean equilibrium charges (MEC). The agreement between experiment and theory in this investigation is accounted to the reliability of the used post-acceleration system where all the backscattering charge-states, at certain incident ion's velocity, are separated and collected in one measurement.

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Epitaxial growth of bcc Fe films on Al(100) surfaces using Ti as an interface stabilizer

et al. 2004

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Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling

Cited by 4 publications

References 22 publications

Thermal and chemical stability of epitaxial Fe films grown on the Ti-stabilized Al(100) surface

Thermal and chemical stability of epitaxial Fe films grown on the Ti-stabilized Al(100) surface

Theoretical Interpretation of Atomic Charge Exchange between Singly Charged Helium Ions and Aluminum Foils

Epitaxial growth of bcc Fe films on Al(100) surfaces using Ti as an interface stabilizer

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