2014
DOI: 10.1088/2053-1591/1/3/035904
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Low energy Ar+ion irradiation induced surface modification in cadmium zinc telluride (CdZnTe)

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Cited by 13 publications
(14 citation statements)
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“…The experiments were performed at the UHFI (ultra-high flux irradiation) and IMPACT (interaction of materials with particles and components testing) surface characterization laboratories [23][24][25]31] at the center for materials under extreme environment (CMUXE), Purdue University. 0.5 mm-thick Nb foils (99.8% purity, annealed) were cut into 10×10 mm samples and mechanically polished to a mirror-like finish.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The experiments were performed at the UHFI (ultra-high flux irradiation) and IMPACT (interaction of materials with particles and components testing) surface characterization laboratories [23][24][25]31] at the center for materials under extreme environment (CMUXE), Purdue University. 0.5 mm-thick Nb foils (99.8% purity, annealed) were cut into 10×10 mm samples and mechanically polished to a mirror-like finish.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The experiments have been performed at the surface characterization laboratories UHFI (ultra-high flux irradiation) and IMPACT (interaction of materials with particles and components testing) [41] of the center for materials under extreme environment (CMUXE) at Purdue University. Cold rolled Mo sheets having purity of 99.95% and thickness of 0.5 mm have been used for these experiments.…”
Section: Experimental Conditionsmentioning
confidence: 99%
“…Corresponding high-resolution FE-SEM images are also shown for reference. All spectra were resolved into their respective components by a mixed Gaussian-Lorentzian (GL, m = 30) line shape (where m = 0 is pure Gaussian and m = 100 is pure Lorentzian) using commercial Casa-XPS peak-fitting software [43]. For all high-resolution XPS spectra, the major fitting parameters, binding energy (BE) and full width at half maxima (FWHM) are summarized in Table 1.…”
Section: X-ray Photoelectron Spectroscopy (Xps) Studiesmentioning
confidence: 99%