Low-dose X-ray sensing nature of nanostructured Zn(Cu)O thick films

Karthieka, R.R.; Subashini, T.; S, Lakshmi Devi.; Prakash, T.

doi:10.1016/j.sna.2019.111801

Cited by 9 publications

(2 citation statements)

References 25 publications

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“…After being peeled off the photosheet paper, wet-etching was performed for 15 min using ferric chloride hexahydrate (0.3 g of FeCl 3 .6H 2 O, 97%, M/s Loba chemie, India) solution to remove the unmasked region of copper coating from the PCB. The dimension of the wet-etch IDE was discussed elsewhere by Karthieka et al [12]. After cleaning using acetone, tin was over deposited on copper pattern by electroless deposition using a bath made of stannous chloride dihydrate (0.1 g of SnCl 2 .2H 2 O, 99%, M/s SRL, India), thiourea (0.4 g of CH 4 N 2 S, 99%, M/s SRL India) and sulphamic acid (0.6 g of H 3 NO 3 S, 99.5%, M/s SRL, India) in 20 ml of double-distilled water.…”

Section: X-ray-induced Photocurrent Studiesmentioning

confidence: 99%

“…Recently, our research group has explored the possibility of utilizing semiconductors such as Cu 2 HgI 4 [9], CsPbI 3 [10], BiOI [11] and Zn(Cu)O [12] for direct conversion low-dose (mGy) x-ray sensors based on the x-ray-induced photocurrent measurements under biased condition. In general, a semiconductor with high x-ray attenuation is an ideal candidate for such sensor development.…”

Section: Introductionmentioning

confidence: 99%

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Dose-dependent x-ray sensing nature of nanocrystalline bismuth phosphate thick films

Begum

Karthieka

Kumar

et al. 2020

Semicond. Sci. Technol.

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Bismuth and its compounds have been used in various optoelectronic devices because of their unique physical properties and non-toxic nature. In this present study, nanocrystalline bismuth phosphate (BiPO4) was synthesized by solid-state double exchange reaction and then processed at 150 °C for 30 min under nitrogen gas flow. The phase, morphology, purity and band gap of the sample were analyzed respectively using x-ray diffraction, scanning electron microscopy-energy dispersive x-ray, Fourier transform infrared, Raman and diffuse reflectance spectroscopy. The obtained results reveal that the sample exists in hexagonal phase with crystallites in sub-spherical morphology (∼84 nm) and having a direct transition band gap of 4.52 eV. Furthermore, the x-ray attenuating nature of nanocrystalline BiPO4 thick film was examined using an intra-oral diagnostic x-ray machine interfaced with a Suniray-2 radiography image sensor. A theoretical validation of the obtained x-ray attenuating nature was carried out using the NIST-XCOM online resource. Then, x-ray-induced photocurrent was measured for nanocrystalline BiPO4 thick (200 µm) film for four different doses (mGy) exposed under biased condition (2 V). A grain boundary double Schottky potential barrier height (ϕb) model was applied to explain the observed linear dose-dependent x-ray sensing nature.

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Section: X-ray-induced Photocurrent Studiesmentioning

confidence: 99%