2019
DOI: 10.1016/j.micron.2019.01.014
|View full text |Cite
|
Sign up to set email alerts
|

Low dose scanning transmission electron microscopy of organic crystals by scanning moiré fringes

Abstract: This is a repository copy of Low dose scanning transmission electron microscopy of organic crystals by scanning moiré fringes.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
22
0

Year Published

2020
2020
2021
2021

Publication Types

Select...
7
1

Relationship

1
7

Authors

Journals

citations
Cited by 21 publications
(22 citation statements)
references
References 55 publications
0
22
0
Order By: Relevance
“…There are two general approaches towards the unavoidable beam interactions; mitigating the effects or exploiting them. High fluence has been reported to damage organic crystals in a conventional TEM setup 22 , however, the high input energy from the electron beam can also induce nucleation and enable crystal growth by radiolysis of the solvent 23 . The beam effects can be reduced by minimising the dose absorbed by the sample by using a low-dose rate and restricted exposure time; radiolysis can also be mitigated by providing a constant flow of undisturbed solvent through the liquid cell 24,25 .…”
Section: Resultsmentioning
confidence: 99%
“…There are two general approaches towards the unavoidable beam interactions; mitigating the effects or exploiting them. High fluence has been reported to damage organic crystals in a conventional TEM setup 22 , however, the high input energy from the electron beam can also induce nucleation and enable crystal growth by radiolysis of the solvent 23 . The beam effects can be reduced by minimising the dose absorbed by the sample by using a low-dose rate and restricted exposure time; radiolysis can also be mitigated by providing a constant flow of undisturbed solvent through the liquid cell 24,25 .…”
Section: Resultsmentioning
confidence: 99%
“…A further technique that has been used to obtain high-resolution, atomic lattice information at low electron fluence is the formation of scanning Moiré fringes (SMFs) in STEM (78)(79)(80). Scanning Moiré fringes arise from the interference between the atomic plane spacings in a crystal lattice and spacings in a similarly sized reference lattice, produced by the scanning of the electron beam.…”
Section: Low Dose Stem Approachesmentioning
confidence: 99%
“…Effectively the Moiré pattern produces a magnified image of the crystal lattice, including any imperfections, and allows lower magnification acquisitions and therefore larger areas to be imaged at a lower electron fluence than would normally be required. S'ari et al (54,79) have applied this to molecular crystalline materials and highlighted the ability to image, albeit indirectly, crystalline defects and surface strain, as shown in Figure 7.…”
Section: Low Dose Stem Approachesmentioning
confidence: 99%
“…We have fitted each two-dimensional (2D) reciprocal space maps (RSMs) of the {110} reflections to determine the fading curves of the diffraction intensity using a symmetrical 2D Gaussian function. The {110} reflections contain four peaks: (110), (-110), (-1-10) and (1)(2)(3)(4)(5)(6)(7)(8)(9)(10).…”
Section: Fig 1a Illustrates a Pulsed Electron Beam Generated By The Nmentioning
confidence: 99%
“…Less common inelastic scattering from electron-electron interactions can cause ionization damage (radiolysis). Both scattering processes contribute to electrostatic charging, hydrocarbon contamination and heating of the sample [3][4][5] . Radiolysis in particular rapidly damages organic and biological crystal structure; intensity and contrast in diffraction patterns will fade as the same area of the sample is exposed to an increasing dose of beam electrons 3,6 .…”
Section: Introductionmentioning
confidence: 99%