2017 International Test Conference in Asia (ITC-Asia) 2017
DOI: 10.1109/itc-asia.2017.8097100
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Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE

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Cited by 5 publications
(2 citation statements)
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“…This system has flexibility, but its cost is relatively high and its size is large as well as the distortion of its generated signal may not be very low. The third method is the usage of the digital ATE eliminating the need for an IEICE Electronics Express, Vol.VV, No.NN, 1-6 analog option [18,19]. There the harmonics of a rectangular wave are suppressed by a high order and high performance analog filter, which may be large, and expensive [30].…”
Section: Sine Wave Generation For Analog Device Testmentioning
confidence: 99%
See 1 more Smart Citation
“…This system has flexibility, but its cost is relatively high and its size is large as well as the distortion of its generated signal may not be very low. The third method is the usage of the digital ATE eliminating the need for an IEICE Electronics Express, Vol.VV, No.NN, 1-6 analog option [18,19]. There the harmonics of a rectangular wave are suppressed by a high order and high performance analog filter, which may be large, and expensive [30].…”
Section: Sine Wave Generation For Analog Device Testmentioning
confidence: 99%
“…Compared to a 16-bit direct digital synthesizer (DDS) sinusoidal signal generator with equivalent performance to the ATE system one, the proposed generator further reduces HD3 by 3 dB and in-band noise by 10 dB, which results in harmonic distortion of −95 dBc for 100 kHz sinusoidal signal generation. Notice that sinusoidal signals are widely used as input signals for AC characteristics and linearity testing of AMS circuits [4,5,6,7,8,9,10,11,12,13,14,15,16,17,18,19]. This is because their low distortion generation is relatively simple, compared to the ramp signal.…”
Section: Introductionmentioning
confidence: 99%