1976
DOI: 10.1299/kikai1938.42.1625
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Low Cycle Fatigue under Varying Strain Conditions : Effects of Mean Plastic Strain and Stress

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Cited by 10 publications
(4 citation statements)
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“…These can be summarized into four basic reasons: (1) stress intensification effect, (2) damage interaction effect, (3) damage sequence effect, and (4) crack mouth opening effect. In a strain-controlled H-L sequence two-step test, the stress amplitude of the second step became larger than the results reported for the constant amplitude test [8,[11][12][13][14][15][16]. The strain hardening induced in the first step raised the stress amplitude of the second step.…”
Section: Introductionmentioning
confidence: 82%
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“…These can be summarized into four basic reasons: (1) stress intensification effect, (2) damage interaction effect, (3) damage sequence effect, and (4) crack mouth opening effect. In a strain-controlled H-L sequence two-step test, the stress amplitude of the second step became larger than the results reported for the constant amplitude test [8,[11][12][13][14][15][16]. The strain hardening induced in the first step raised the stress amplitude of the second step.…”
Section: Introductionmentioning
confidence: 82%
“…The loading sequence effect was also investigated by fatigue tests conducted for strain-controlled conditions. A strain amplitude sequence of H-L in the two-step test reduced the fatigue life of Type 304 [11], 304L [8,12], 305 [13], 316 [14] and 316L [15,16] stainless steels. On the contrary, the opposite sequence, the L-H sequence caused a longer fatigue life than that predicted by the LDR.…”
Section: Introductionmentioning
confidence: 99%
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“…Segundo Kim, Son & Park (2008), a regra de Palmgren -Miner (1945, apud DRAPER, 2008 (KIKUKAWA et al, 1977) De acordo com a teoria linear de Palmgren -Miner, uma fração do dano em qualquer nível de tensão é linearmente proporcional à razão entre o número de ciclos da operação e o número de ciclos total que produz a falha neste nível de tensão. O dano total é dado como a somatória de todas as frações e a falha ocorre quando esta é igual ou maior que 1, conforme mostrado pela equação 5.3.…”
Section: Acúmulo Do Dano Para Sinais Complexosunclassified