Low cost TID testing of COTS components

Barnard, Arno; Steyn, Willem J.

doi:10.1109/radecs.2007.5205562

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Low cost TID testing of COTS components

Cited by 4 publications

References 6 publications

Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring Systems

Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring Systems

COTS Based On-Board-Computer on South Africa's Sumbandilasat: A Radiation and In-Orbit Performance Analysis

Features of the Software Component of the Memory Test SetupBased on the Object-Oriented Approach in LabVIEW Development Environment

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