1995
DOI: 10.1109/77.384561
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Low and midrange modulation frequency response for YBCO infrared detectors: interface effects on the amplitude and phase

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Cited by 15 publications
(55 citation statements)
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“…According to [16] and [17], the corresponding diffusivity for bulk SrTiO is 0.12 cm s. The diffusivity values found here which is derived from the basic thermal diffusion process differs from the previously reported values. This is interpreted to be due to the fact that our calculation here is mostly based on the lateral thermal conductance where [16] and [17] report the values for bulk material and for vertical thermal conductance. Hence, from an engineering point of view, one can use the diffusivity values in Table I for the calculations of the lateral thermal diffusion process for design optimizations targeting crosstalk-free operation.…”
Section: A Effect Of Separation Between the Devices On The Crosstalkcontrasting
confidence: 79%
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“…According to [16] and [17], the corresponding diffusivity for bulk SrTiO is 0.12 cm s. The diffusivity values found here which is derived from the basic thermal diffusion process differs from the previously reported values. This is interpreted to be due to the fact that our calculation here is mostly based on the lateral thermal conductance where [16] and [17] report the values for bulk material and for vertical thermal conductance. Hence, from an engineering point of view, one can use the diffusivity values in Table I for the calculations of the lateral thermal diffusion process for design optimizations targeting crosstalk-free operation.…”
Section: A Effect Of Separation Between the Devices On The Crosstalkcontrasting
confidence: 79%
“…The distance between the device and is 170 m. If we substitute the above values in (2), we get a diffusivity value of 0.027 at , as shown in Table I. According to [16] and [17], the corresponding diffusivity for bulk SrTiO is 0.12 cm s. The diffusivity values found here which is derived from the basic thermal diffusion process differs from the previously reported values. This is interpreted to be due to the fact that our calculation here is mostly based on the lateral thermal conductance where [16] and [17] report the values for bulk material and for vertical thermal conductance.…”
Section: A Effect Of Separation Between the Devices On The Crosstalkmentioning
confidence: 54%
“…The magnitude of the bolometric response can easily be calculated with a simple RC-model resulting in following expression [13,[20][21][22]:…”
Section: Introductionmentioning
confidence: 99%
“…150 nm thick YBCO thin films were grown on the STO substrates, with and without the CeO 2 layer, by offaxis RF magnetron sputtering system. These YBCO thin films were patterned using standard photolithographic techniques [15] with an accuracy of about 0.6µm, to form a meanderline pattern with 55 µm linewidth providing an active area of 1.44 mm 2 for the device. Considering these dimensions for the pattern, a room temperature resistance of∼ 6.5 KΩ, the critical transition temperature (T Conset ) of 90 K with R onset around 2.2KΩ and a transition width of ∼1.9 K were obtained for the deposited film.…”
Section: A Device Preparationmentioning
confidence: 99%