2005
DOI: 10.1063/1.1916662
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Looking for Multiple Scattering Effects in Backscattered Ultrasonic Grain Noise from Jet-Engine Nickel Alloys

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Cited by 19 publications
(9 citation statements)
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“…Other scattering configurations where the incident wave is scattered into an arbitrary direction are dependent on other components of N abcd ijkl . [48][49][50] Additionally, other scattering related phenomenon such as ultrasonic attenuation [21][22][23][24][25]51 and radiative transfer of ultrasound 48,[52][53][54] depend on inner products with N. The stress-dependence of each of these models is included by using the definition of N defined in this article.…”
Section: Resultsmentioning
confidence: 99%
“…Other scattering configurations where the incident wave is scattered into an arbitrary direction are dependent on other components of N abcd ijkl . [48][49][50] Additionally, other scattering related phenomenon such as ultrasonic attenuation [21][22][23][24][25]51 and radiative transfer of ultrasound 48,[52][53][54] depend on inner products with N. The stress-dependence of each of these models is included by using the definition of N defined in this article.…”
Section: Resultsmentioning
confidence: 99%
“…Thus, experimental data that do not appear to satisfy this assumption may ultimately be understood. Margetan et al 57 have shown the effects of multiple scattering in backscatter measurements for a strong scattering material. The present model can also predict the response for a pitch-catch scattering measurement setup where the transmitter and the receiver transducer are oriented at an angle relative to one another.…”
Section: Discussionmentioning
confidence: 99%
“…This is often found to be a reasonable assumption in practice, especially near the focal zone of a focused transducer, since multiple scattering events whose last scatter occurs outside of the sonic beam footprint are expected to generate very weak received signals. However multiple-scattering contributions can be significant in some circumstances, such as for larger grain sizes, inspections at higher frequencies, and depth zones not near the focal plane [9]. To better address the influence of multiple scattering, a "full scattering" model is under development by Ron Roberts of CNDE which accounts for all orders of multiple scattering [10].…”
Section: Figurementioning
confidence: 99%