“…Compared with XFELs which produce only one diffraction pattern for every microcrystal, synchrotron microdiffraction beamlines are optimized for collection of a small wedge of rotation data from each microcrystal, thus greatly improving data quality from microcrystals (Smith et al, 2012;Fuchs et al, 2016;Yamamoto et al, 2017). With the implementation of new data collection methods, microcrystal data acquisition at synchrotrons is now routine and maturing (Gati et al, 2014;Coquelle et al, 2015;Zander et al, 2015;Diederichs & Wang, 2017;Owen et al, 2017;Sanishvili & Fischetti, 2017;Gao et al, 2018;Huang et al, 2018;Basu et al, 2019;Cianci et al, 2019;Dauter, 2019;Guo et al, 2019).…”