“…Pit quantification/analysis requires the use of different imaging techniques, analysis software, and user input to be able to accurately determine pitting characteristics like pit depth, volume, density, etc. For example, Srinivasan et al and Weirich et al, 2,3 utilized optical and electron microscopy, profilometry, focused ion beam (FIB), and X-ray tomography (XCT) to image and quantify pits. However, due to limitations with line-of-sight nature of some instruments, determining a threshold procedure for profilometry, and post processing data quantification of pitting damage was still a challenge.…”