Log‐location‐scale increment degradation model: A Bayesian perspective
I‐Tang Yu,
Kuei‐Mao Wang
Abstract:Degradation modeling serves as a valuable tool for assessing the lifetime information of highly reliable products. One frequently employed approach for describing the degradation phenomenon involves the use of a degradation model that relies on stochastic processes. In a stochastic‐process‐based degradation model, it is assumed that the increments follow a distribution with the additivity property. This property makes the further inferences mathematically and statistically tractable. However, it limits the cho… Show more
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