1998
DOI: 10.1016/s0035-3159(98)80047-0
|View full text |Cite
|
Sign up to set email alerts
|

Lock-in thermography for nondestructive evaluation of materials

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
136
0
1

Year Published

2004
2004
2019
2019

Publication Types

Select...
6
3

Relationship

0
9

Authors

Journals

citations
Cited by 288 publications
(151 citation statements)
references
References 12 publications
0
136
0
1
Order By: Relevance
“…can be evaluated through its emission in the MWIR range and reconstructed by means of four equidistant data points S i (x,y) recorded over the specimen surface during each modulation period [12]. These four images are then processed in the frequency domain using the Fourier transformation tuned to the frequency of amplitude modulation to gain the magnitude image A(x,y) and the phase image φ (x,y):…”
Section: Qirt 10mentioning
confidence: 99%
“…can be evaluated through its emission in the MWIR range and reconstructed by means of four equidistant data points S i (x,y) recorded over the specimen surface during each modulation period [12]. These four images are then processed in the frequency domain using the Fourier transformation tuned to the frequency of amplitude modulation to gain the magnitude image A(x,y) and the phase image φ (x,y):…”
Section: Qirt 10mentioning
confidence: 99%
“…Thermographic methods broadly divided into two types: passive , in which the temperature pattern of thesurface of material is measured without any external thermal excitation, and active in which thermal energy is artificially injected in to the material to be tested [1] . Although several methods have been proposed over the years to detect delamination defects in solid materials, three of them are predominantly in use: Pulse Thermography (PT), lock in Thermography (LT) and Pulse Phase Thermography (PPT) [2], [3], [4]. However, none has so far been free from certain limitations: Pulse thermography(PT) requires high peak power heat sources and being sensitive to surface emissivity variations and nonuniform heating on the surface of test sample, lock in Thermography (LT) suffers with limited depth resolution and long processing time [5], [6] and Pulse Phase Thermography (PPT) needs high peak power heat sources to detect deeper subsurface defects, which however may damage the surface of the test sample.…”
Section: Introductionmentioning
confidence: 99%
“…Modulated or Lock-In Thermography (LT) [9,10] has many similarities with PPT. In fact in LT a phase shift between defected and sound areas is observed on the measured harmonic response of the component, and this phase contrast represents again the defect signature.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore sampling windows containing a multiple number of signal periods can reduce the influence of noise (e.g. leakage or ripple [3]) and the lock-in correlation between pure sinusoidal waves is straight forward in terms of signal processing [9,10]. The second feature represents a drawback compared to PPT since the measured phase shift at the given carrier frequency might not be the optimised value at different defect depths [11].…”
Section: Introductionmentioning
confidence: 99%