2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2016
DOI: 10.1109/emceurope.2016.7739184
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Localization of the equivalent sources on the PCB surface by using ultra-wideband time domain near-field measurements

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Cited by 24 publications
(11 citation statements)
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“…Such methodology is conclusive, but it is a time consuming task. There are other methods for TD characterization, such as the stochastic approach studied in [11]. Generally, works based on TD analysis relies on the time recording of the data using a high-resolution oscilloscope.…”
Section: Introductionmentioning
confidence: 99%
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“…Such methodology is conclusive, but it is a time consuming task. There are other methods for TD characterization, such as the stochastic approach studied in [11]. Generally, works based on TD analysis relies on the time recording of the data using a high-resolution oscilloscope.…”
Section: Introductionmentioning
confidence: 99%
“…Generally, works based on TD analysis relies on the time recording of the data using a high-resolution oscilloscope. But, this information is usually treated using a spectral study [11].…”
Section: Introductionmentioning
confidence: 99%
“…As far as near-field wideband cases are concerned, the traditional way has been to split the array outputs into several narrowband components by passing them through a bank of narrowband filters and then combine the results of acquired estimates at multiple frequencies independently. Or alternatively, exploiting the focusing technique to obtain the source localisation information integrated into these bands by aligning the signal subspaces of the narrowband components [16][17][18][19]. There are two apparent inadequacies in these methods.…”
Section: Introductionmentioning
confidence: 99%
“…The approach of characterizing noisy EM fields by correlation information has been also extended to the transmission line matrix method in the time domain and to the transverse wave formulation . An approach to propagate the stochastic EM field based on Wigner functions is presented in Gradoni et al Near‐ to far‐field transformation and imaging using correlation information has been addressed in Fourestie et al and Russer and Russer, evolution of the correlation information of the propagating field in Russer et al, and methods for source localization in Baev et al and Kuznetsov et al Propagation of correlation information can also be modeled based on S ‐parameters . Measurement of noisy fields with multiple probes and modeling based on correlation information may facilitate an improved analysis for power and signal integrity issues …”
Section: Introductionmentioning
confidence: 99%