Localization of cyclostationary EMI sources based on near-field measurements

Abstract

The near-field measurements of the stochastic fields radiating by digital electronic devices can be used for the localization of the stochastic electromagnetic interference (EMI) sources on the surface of device under test. The characterization of the space distribution for the wide sense cyclostationary (WSCS) stochastic field in the observation plane can be accomplished by a cross correlation between the reference and all remaining knots. The proposed Tikhonov regularization algorithm in conjunction with L-curve method provides a stable inverse reconstruction of the multi-dipole model distribution in the object plane. Parametric identification procedure based on the model order selection and two-dimensional Matrix Pencil Algorithm with subsequent fitting by Minimum Least Square technique gives the geometrical configuration of the WSCS sources. Implemented simulations and measurement experiments verified the choice of the proposed signal processing EMI sources localization algorithm.