Localization of an ultrathin buried Fe layer in a multilayer structure Nb/Fe/[Mo/Si]40/SiO2 by means of X-ray standing waves

Andreeva,; Gribova, A. D.; Odintsova, E. E.; Borisov, M. M.; Kovalchuk, M. V.; Mukhamedzhanov, E. Kh.

doi:10.3103/s0027134909040183

Cited by 2 publications

(1 citation statement)

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“…However, the problem of the proper determination of the function of the electron yield T(z) (see, for example, Liljequist et al, 1978;Kovalchuk et al, 1986) imposes some limitations on the wide application of the TEY method. The fluorescence yield measurements have shown more advantages in the X-ray standing-wave method mostly due to its element sensitivity and also due to a much simpler form of the yield function T(z) [see reviews by Vartanyants & Koval'chuk (2001) and von Bohlen (2009), and also recent papers (Lee et al, 2006;Bera et al, 2007;Gupta et al, 2007;Novikova et al, 2009;Andreeva et al, 2009)].…”

Section: Introductionmentioning

confidence: 99%

Interference phenomena of synchrotron radiation in TEY spectra for silicon-on-insulator structure

Andreeva

Domashevskaya

Odintsova

et al. 2012

J Synchrotron Radiat

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The general matrix theory of the photoelectron/fluorescence excitation in anisotropic multilayer films at the total reflection condition of X-rays has been developed. In a particular case the theory has been applied to explain the oscillation structure of L(2,3) XANES spectra for a SiO(2)/Si/SiO(2)/c-Si sample in the pre-edge region which has been observed by a sample current technique at glancing angles of synchrotron radiation. Remarkably the phase of the oscillations is reversed by a ∼2° angle variation. The observed spectral features are found to be a consequence of waveguide mode creation in the middle layer of strained Si, which changes the radiation field amplitude in the top SiO(2) layer. The fit of the data required the correction of the optical constants for Si and SiO(2) near the Si L(2,3)-edges.

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