2017
DOI: 10.1063/1.5009745
|View full text |Cite
|
Sign up to set email alerts
|

Localization effects in the disordered Ta interlayer of multilayer Ta–FeNi films: Evidence from dc transport and spectroscopic ellipsometry study

Abstract: Using dc transport and wide-band spectroscopic ellipsometry techniques, we study localization effects in the disordered metallic Ta interlayer of different thicknesses in the multilayer films (MLFs) (Ta–FeNi)N grown by rf sputtering deposition. In the grown MLFs, the FeNi layer was 0.52 nm thick, while the Ta layer thickness varied between 1.2 and 4.6 nm. The Ta layer dielectric function was extracted from the Drude-Lorentz simulation. The dc transport study of the MLFs implies non-metallic (dρ/dT<0) be… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

4
15
0
2

Year Published

2019
2019
2022
2022

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 10 publications
(21 citation statements)
references
References 11 publications
4
15
0
2
Order By: Relevance
“…We would like to note that the estimated dc conductivity values σ 0 =1/ρ 0 (see Table 1) are in good agreement with the optical dc limit σ 1 (ω→0) of the Ta layer Drude response in the MLF samples N1, N2, and N3 of ≃ 2050 (4.6 nm), ≃ 2550 (2.3 nm), and ≃ 4650 (1.3 nm) −1 • cm −1 (depicted in Fig. 5), resulting from our recent spectroscopic ellipsometry study 50 .…”
Section: Temperature-dependent DC Transport Of the Ta-feni Multilayersupporting
confidence: 86%
See 4 more Smart Citations
“…We would like to note that the estimated dc conductivity values σ 0 =1/ρ 0 (see Table 1) are in good agreement with the optical dc limit σ 1 (ω→0) of the Ta layer Drude response in the MLF samples N1, N2, and N3 of ≃ 2050 (4.6 nm), ≃ 2550 (2.3 nm), and ≃ 4650 (1.3 nm) −1 • cm −1 (depicted in Fig. 5), resulting from our recent spectroscopic ellipsometry study 50 .…”
Section: Temperature-dependent DC Transport Of the Ta-feni Multilayersupporting
confidence: 86%
“…8a-d and in our previous papers (see Fig. 4d 30,50 ) one can see the following systematic changes (i) the Drude dc conductivity decreases below the MIR limit and the low-energy band shifts to a higher energy of 2.7 eV in the sample N2, (ii) the Drude dc conductivity increases above the MIR limit and the low-energy band shifts to the lower energy about 1 eV in the samples N5 and N6, and (iii) the intensity of the low-energy band decreases on the conductivity enhancement in the sample N6. According to our simulations, the best metallicity properties among the whole MLF sample series N5-N8 are demonstrated by the Ta layer in the sample N8 (see Table 2 and Fig.…”
Section: Discussionsupporting
confidence: 64%
See 3 more Smart Citations