Local structure and electronic properties in colossally magnetoresistive thin film of La0.87Na0.13MnO3 by Mn-K edge EXAFS and XANES

Ghigna, Paolo; Marzola, Andrea; Amantea, Roberta; Malavasi, Lorenzo; Flor, Giorgio; d’Acapito, Francesco; Bardelli, Fabrizio; Mozzati, Maria Cristina

doi:10.1016/j.nimb.2005.06.055

Cited by 2 publications

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“…Correct cation stoichiometry was also indirectly confirmed by X-ray absorption spectroscopy measurements 24 performed at the Mn-K edge, which showed that the energy position of the edge was the same for all the thin films and the bulk material. Moreover, since for the bulk material the oxygen content was accurately measured 18 to be 3, we are able to also state that the oxygen stoichiometry of the samples should be very close to this value.…”

Section: Methodsmentioning

confidence: 74%

Sodium-Doped LaMnO₃ Thin Films: Influence of Substrate and Thickness on Physical Properties

et al. 2004

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In this paper we report the results of the synthesis and characterization of optimally doped La1 - x Na x MnO3 thin films grown on SrTiO3 (100), NdGaO3 (100), and NdGaO3 (110) for thicknesses ranging from 11 to 82 nm. The effect of substrate nature and orientation, film thickness, and annealing procedure was investigated to optimize their magnetoresistance (MR). We obtained very smooth films displaying MR values greater than 70%, near room temperature.

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Section: Methodsmentioning

confidence: 74%

Sodium-Doped LaMnO₃ Thin Films: Influence of Substrate and Thickness on Physical Properties

et al. 2004

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“…Correct cation stoichiometry was also indirectly confirmed by X-ray absorption spectroscopy measurements 24 performed at the Mn-K edge which showed that the energy position of the edge was the same for all the thin films and the bulk material. Moreover, since for the bulk material the oxygen content was accurately measured 18 to be 3, we are able to state that also the oxygen stoichiometry of the samples should be very close to this value otherwise sensible variation of the Mn-K edge should have been detected.…”

Section: Introductionmentioning

confidence: 75%

Sodium‐Doped LaMnO₃ Thin Films: Influence of Substrate and Thickness on Physical Properties.

et al. 2004

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Sodium-Doped LaMnO 3 Thin Films: Influence of Substrate and Thickness on Physical Properties. -Optimally doped La0.85Na0.15MnO3 thin films are deposited on SrTiO3(100), NdGaO3(100), and NdGaO3(110) single crystals by rf-magnetron sputtering with various thicknesses ranging from 11 to 82 nm. The samples are characterized by XRD, AFM, resistance measurements, EPR, and magnetization measurements on the films grown on SrTiO 3 . The smooth films display magnetoresistance values greater than 70% near room temperature. -(MALAVASI*, L.; MOZZATI, M. C.; ALESSANDRI, I.; DEPERO, L. E.; AZZONI, C. B.; FLOR, G.; J.

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Local structure and electronic properties in colossally magnetoresistive thin film of La0.87Na0.13MnO3 by Mn-K edge EXAFS and XANES

Cited by 2 publications

References 13 publications

Sodium-Doped LaMnO₃ Thin Films: Influence of Substrate and Thickness on Physical Properties

Sodium-Doped LaMnO₃ Thin Films: Influence of Substrate and Thickness on Physical Properties

Sodium‐Doped LaMnO₃ Thin Films: Influence of Substrate and Thickness on Physical Properties.

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Local structure and electronic properties in colossally magnetoresistive thin film of La0.87Na0.13MnO3 by Mn-K edge EXAFS and XANES

Cited by 2 publications

References 13 publications

Sodium-Doped LaMnO3 Thin Films: Influence of Substrate and Thickness on Physical Properties

Sodium-Doped LaMnO3 Thin Films: Influence of Substrate and Thickness on Physical Properties

Sodium‐Doped LaMnO3 Thin Films: Influence of Substrate and Thickness on Physical Properties.

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Sodium-Doped LaMnO₃ Thin Films: Influence of Substrate and Thickness on Physical Properties

Sodium-Doped LaMnO₃ Thin Films: Influence of Substrate and Thickness on Physical Properties

Sodium‐Doped LaMnO₃ Thin Films: Influence of Substrate and Thickness on Physical Properties.