Local measurement of weak stresses on the surface of HgCdTe/CdTe/ZnTe/GaAs structures using the null method

Abstract

A study of residual mechanical stresses in the surface layer of the HgCdTe/CdTe/ZnTe/GaAs structure based on the registration of the second harmonic signal characteristics of reflected IR laser radiation from the surface of the studied sample passed through a nonlinear crystal was carried out. It is shown that such a sensitive method makes it possible to obtain information about the anisotropy of the polarization of the reflected radiation, caused by the residual deformation. Observations of the fine structure of the angular sweep of the second harmonic signal suggest a complex structure of residual stresses related to the presence of misoriented areas. The results were compared with data obtained from measurements of the azimuthal dependence of the self-reflected second harmonic signal from the sample surface.