2007
DOI: 10.1016/j.jlumin.2007.02.050
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Local field enhancements on gold and silver nanostructures for aperture near field spectroscopy

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Cited by 11 publications
(6 citation statements)
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“…SNOM analysis has been carried out in order to clarify the spatial localization of the hot spots (sites of strong field scattering) on the sample surface. The ability of aperture SNOM in measuring the field intensity is limited in the case of densely nanostructured surfaces as, for instance, semicontinuous gold films produced at the limit of percolation , or randomly distributed nanostructures . This is a consequence of the impossibility for the apertured near-field probe to approach very close to the surface in the case of randomly distributed nanostructures consisting of nanosized holes or pores.…”
Section: Resultsmentioning
confidence: 99%
“…SNOM analysis has been carried out in order to clarify the spatial localization of the hot spots (sites of strong field scattering) on the sample surface. The ability of aperture SNOM in measuring the field intensity is limited in the case of densely nanostructured surfaces as, for instance, semicontinuous gold films produced at the limit of percolation , or randomly distributed nanostructures . This is a consequence of the impossibility for the apertured near-field probe to approach very close to the surface in the case of randomly distributed nanostructures consisting of nanosized holes or pores.…”
Section: Resultsmentioning
confidence: 99%
“…39 The typical control of probe– sample interaction is based on shear forces measured with a tuning fork or with a standard AFM controller. 40 If the optical excitation (or the detection) is passing through the aperture, the excitation (or detection) is qualified as “near field” while the detection (or the excitation) is performed in the “far field.” Different configurations of near- and far-field excitation and detection can be performed. For the study of plasmonic nanostructures, a variety of optical signals can be measured using SNOM (fluorescence, luminescence, elastically or inelastically light scattered, second or third harmonic generation, etc.).…”
Section: Optical Near-field Microscopymentioning
confidence: 99%
“…In addition, Quelin and coworkers have developed a statistical method for characterizing the strength of NSOM-monitored field enhancements on discontinuous Au films to suggest ideal substrate architectures for SERS. 120 Near-field scanning optical microscopy resolution has traditionally been limited to ϳ50 to 100 nm based on the skin-depth of aluminum used for fabrication of nanoscale aperture probes. To overcome this limitation, apertureless NSOM (ANSOM) has been implemented using metallic or dielectric tip-scattered light as an evanescent field source near the sam-ple.…”
Section: Fig 7 First Direct Evidence Of Surface Plasmon Polariton-lmentioning
confidence: 99%