2006
DOI: 10.1063/1.2219398
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Local electron beam induced reduction and crystallization of amorphous titania films

Abstract: Structural and electronic characterization of 355 nm laser-crystallized silicon: Interplay of film thickness and laser fluence

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Cited by 31 publications
(37 citation statements)
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“…35 Under exposure condition N°2, the global substrate heating during 5 s is considered negligible, while the estimated temperature rise of about 130°C in the beam center according to eq 2 is far below the crystallization temperature of 440°C for electrolytically deposited TiO 2 films. 36 This decrease in crystallization temperature is even more pronounced than previously reported for irradiation under SEM conditions at 2 Acm -2 during 600 s with additional substrate preheating at 250°C, 34 reaching an estimated temperature of about 270°C in the beam center. It was shown that the crystallization was limited to the irradiated zone even after long and intense exposure.…”
Section: Localized Reduction and Crystallizationmentioning
confidence: 48%
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“…35 Under exposure condition N°2, the global substrate heating during 5 s is considered negligible, while the estimated temperature rise of about 130°C in the beam center according to eq 2 is far below the crystallization temperature of 440°C for electrolytically deposited TiO 2 films. 36 This decrease in crystallization temperature is even more pronounced than previously reported for irradiation under SEM conditions at 2 Acm -2 during 600 s with additional substrate preheating at 250°C, 34 reaching an estimated temperature of about 270°C in the beam center. It was shown that the crystallization was limited to the irradiated zone even after long and intense exposure.…”
Section: Localized Reduction and Crystallizationmentioning
confidence: 48%
“…Previous irradiations with Gaussian SEM probe intensities have led to Gaussian profiles within the oxide. 34 The shape and lateral uniformity of the irradiated spots in Figure 4 do not indicate a major contribution of backscattered electrons to oxygen loss. The lateral extension of the symmetric volume losses in Figures 3 and 4 was considered as approximate e-beam probe size to calculate exposure current densities in Table 1.…”
Section: Localized Reduction and Crystallizationmentioning
confidence: 95%
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“…Different PbTe and PbTe‐Au nanocrystal morphologies were produced depending on the synthesis conditions, whose the details are reported elsewhere (Franchini et al, 2010).…”
Section: Methodsmentioning
confidence: 99%