Local electrical characterization of two-dimensional materials with functional atomic force microscopy

Investigating Size-Dependent Conductive Properties on Individual Si Nanowires

“…In recent decades, scanning probe microscopy (SPM)based electrical measurements reveal themselves as powerful techniques for electrical characterizations at nanoscale [29,30]. Among these SPM techniques, conductive atomic force microscopy (CAFM) has been successfully applied to study the conductive properties on single or individual nanostructures [30][31][32].…”

A two-dimensional MoS2/C3N broken-gap heterostructure, a first principles study

“…Two-dimensional (2D) materials, such as graphene, graphitic carbon nitrides and transition-metal chalcogenides (TMDs), have attracted tremendous interest because of their special physical and chemical properties 1,2 and their potential use in electronic and optoelectronic devices. 3,4 Monolayer MoS 2 is a semiconductor material with a direct band gap of 1.8 eV, which makes it a candidate for applications in photodetectors, photovoltaics, and photocatalysis.…”

Scanning Probe Spectroscopy of WS2/Graphene Van Der Waals Heterostructures

“…In the literature, the thickness measured of a WS 2 sheet on a WS 2 substrate is equal to 0.6 nm [ 8 , 9 , 10 , 11 , 12 , 13 , 14 , 15 , 16 , 17 , 18 , 19 , 20 , 21 , 22 , 23 , 24 , 25 , 26 , 27 , 28 , 29 ]. Therefore, our data are consistent with what previously reported, considering the error bar.…”

“…However, once the formation of the desired structures has been confirmed, other instruments are needed in order to access the physical properties on the nanoscale. These properties range from simple morphology to elastic [ 9 ] and electrostatic ones [ 10 ]. In addition, a complete characterization should also include the study of subsurface features, such as the conditions of the buried interfaces, that can strongly affect the elastic and the electrical properties as well as the desired performances of these heterostructures [ 11 ].…”