2009
DOI: 10.1088/0953-2048/22/12/125027
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Local anodic oxidation of superconducting NbN thin films by an atomic force microscope

Abstract: A local anodic oxidation technique has been applied to create oxidized nanowires on superconducting NbN thin films using an atomic force microscope (AFM) with a conductive probe. The AFM surface topography shows that both the width and height of the oxidized nanowires increase with increasing applied probe voltage under a certain relative humidity and a probe scan rate. The resistances of the NbN microbridges with and without an oxidized nanowire crossing were measured, and the results indicate that the oxidiz… Show more

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Cited by 3 publications
(2 citation statements)
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“…Several nanofabrication techniques have been used in SNSPDs fabrication. These include e-beam lithography (EBL) [1][2][3][4][5][6][7][8][9][10][11], focused ion beam (FIB) [13], and local oxidation with an atomic force microscope (AFM) [14,15]. However, these techniques usually require expensive equipments, and are time consuming for fabricating devices with large active area and, particularly for making the multi-element devices.…”
Section: Introductionmentioning
confidence: 99%
“…Several nanofabrication techniques have been used in SNSPDs fabrication. These include e-beam lithography (EBL) [1][2][3][4][5][6][7][8][9][10][11], focused ion beam (FIB) [13], and local oxidation with an atomic force microscope (AFM) [14,15]. However, these techniques usually require expensive equipments, and are time consuming for fabricating devices with large active area and, particularly for making the multi-element devices.…”
Section: Introductionmentioning
confidence: 99%
“…The superconducting nanowire single photon detector (SNSPD) has attracted extensive attention since 2001 when Gol'tsman et al showed first that the superconducting NbN nanowire made from ultra-thin NbN film could achieve single photon detection. [1,2] In most reported works on SNSPD, the devices were fabricated by using electron beam lithography (EBL), [3] although some other techniques such as focused ion beam (FIB) [4] and atomic force microscope (AFM) [5,6] were employed too. However, the EBL process requires expensive equipment and cannot meet the low cost and high efficiency requirement for mass production.…”
Section: Introductionmentioning
confidence: 99%