2017
DOI: 10.1002/adma.201770090
|View full text |Cite
|
Sign up to set email alerts
|

Lithium Dendrites: Liquid‐Phase Electrochemical Scanning Electron Microscopy for In Situ Investigation of Lithium Dendrite Growth and Dissolution (Adv. Mater. 13/2017)

Abstract: An in-situ liquid-phase electrochemical scanning electronic microscopy (EC-SEM) method is developed to systematically study the lithium plating/stripping processes in liquid electrolytes, as described in article number 1606187 by Yuegang Zhang and co-workers. The results demonstrate that the lithium dendrite growth speed and mechanism are greatly affected by the additives in the ether-based electrolyte.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2021
2021
2021
2021

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…The results (figure 10) suggest that LiNO 3 can oxidize the shuttled polysulfides to Li 2 SO 3 and Li 2 SO 4 while itself is reduced to LiNO 2 , resulting in the formation of a dense and stable SEI layer on lithium anode during the initial discharge process. Besides, some other in situ/operando characterization techniques (such as electrochemical scanning electronic microscopy) also confirm this scenario [146].…”
Section: The Mechanism Of Shuttle Effect Caused By Lithium Polysulfidesmentioning
confidence: 77%
“…The results (figure 10) suggest that LiNO 3 can oxidize the shuttled polysulfides to Li 2 SO 3 and Li 2 SO 4 while itself is reduced to LiNO 2 , resulting in the formation of a dense and stable SEI layer on lithium anode during the initial discharge process. Besides, some other in situ/operando characterization techniques (such as electrochemical scanning electronic microscopy) also confirm this scenario [146].…”
Section: The Mechanism Of Shuttle Effect Caused By Lithium Polysulfidesmentioning
confidence: 77%