2011
DOI: 10.1116/1.3660792
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Liquid transfer imprint lithography: A new route to residual layer thickness control

Abstract: In this study, an extension of the soft UV nanoimprint process is presented with improved control of the residual layer thickness and significant reduction of the nanoimprint proximity effect. The process is based on the consecutive halving of the liquid resist layer by a liquid transfer process. In the initial stage, this liquid transfer process uses a thick initial resist layer to ensure complete filling of the stamp cavities. The thick residual layer is then thinned down to about half by peeling off the app… Show more

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Cited by 27 publications
(20 citation statements)
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“…In the future, particularly in view of upscaling replication to large scale roll-to-roll processes, a combination of MIMIC and NIL could help to achieve low residual layer imprinting of thermoplastic and UVcurable materials. For this, resist transfer methods such as liquid transfer imprint lithography (LTIL) could be advantageous 56,57 .…”
Section: Discussionmentioning
confidence: 99%
“…In the future, particularly in view of upscaling replication to large scale roll-to-roll processes, a combination of MIMIC and NIL could help to achieve low residual layer imprinting of thermoplastic and UVcurable materials. For this, resist transfer methods such as liquid transfer imprint lithography (LTIL) could be advantageous 56,57 .…”
Section: Discussionmentioning
confidence: 99%
“…To improve this issue, we have developed efficient process by using liquid transfer imprint lithography (LTIL) technique. LTIL is one candidate for solving these problems because excess resin is split from the mold in the liquid phase [5][6][7]. As a result, we can obtain five layers stacking of gold dots and silver dots in transparent resin layer [8].…”
Section: Introductionmentioning
confidence: 99%
“…This layer must be removed in a semiconductor process, so it is desirable that it is as thin as possible. Liquid-transfer imprint lithography (LTIL) is one candidate for solving the residual-layer problem [3]. Although it was first reported as recently as 2013, LTIL is now widely used in a range of applications.…”
Section: Introductionmentioning
confidence: 99%