Linearity Enhancement Analysis of Breakdown Voltage Doubler and Demonstration in 60 GBd SiGe BiCMOS Driver

De Bruyn, Kieran; Pannier, Tinus; Declercq, Jakob; Breyne, Laurens; Yin, Xin; Ossieur, Peter; Bauwelinck, Johan

doi:10.1109/iscas58744.2024.10558547

2024 IEEE International Symposium on Circuits and Systems (ISCAS) 2024

DOI: 10.1109/iscas58744.2024.10558547

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Linearity Enhancement Analysis of Breakdown Voltage Doubler and Demonstration in 60 GBd SiGe BiCMOS Driver

Kieran De Bruyn,

Tinus Pannier,

Jakob Declercq

et al.

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Linearity Enhancement Analysis of Breakdown Voltage Doubler and Demonstration in 60 GBd SiGe BiCMOS Driver

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