Line Spread Function and Cumulative Line Spread Function for Systems with Rotational Symmetry

Barakat, Richard; Houston, Agnes

doi:10.1364/josa.54.000768

Cited by 31 publications

(12 citation statements)

References 7 publications

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“…2(c)], in the continuum limit as the number of scan lines increases, the combined scan q is q(x) = J s(x -x')h(x')dx' (3) and characterizing the system to any resolution involves a straightforward inversion of this equation to solve for the PSF h. In real scans, noise is a problem, registration is imperfect, and resolution is necessarily limited by the finite number of scans (2) used. These problems are illustrated in the combined scan q Under these conditions, when a large number of scans are used, sample/scene phase bias, residual noise, and misregistration errors are negligible.…”

Section: Knife-edge Methods For Digital Devicesmentioning

confidence: 99%

Characterizing digital image acquisition devices

1991

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Section: Knife-edge Methods For Digital Devicesmentioning

confidence: 99%

Characterizing digital image acquisition devices

1991

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“…The image of a single narrow slit is called the line-spread function. The image of a point object is independent of the degree of coherence, but the line spread function is different for coherent and incoherent illumination (Barakat & Houston, 1964). [But note that the image of a point in differential interference contrast does depend on the condenser aperture (Mehta & Sheppard, 2015).]…”

Section: And Furthermentioning

confidence: 99%

Resolution and super‐resolution

Sheppard

2017

Microscopy Res & Technique

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Many papers have claimed the attainment of super-resolution, i.e. resolution beyond that achieved classically, by measurement of the profile of a feature in the image. We argue that measurement of the contrast of the image of a dark bar on a bright background does not give a measure of resolution, but of detection sensitivity. The width of a bar that gives an intensity at the center of the bar of 0.735 that in the bright region (the same ratio as in the Rayleigh resolution criterion) is λ/(13.9×numerical aperture) for the coherent case with central illumination. This figure, which compares with λ/(numerical aperture) for the Abbe resolution limit with central illumination, holds for the classical case, and so is no indication of super-resolution. Theoretical images for two points, two lines, arrays of lines, arrays of bars, and grating objects are compared. These results can be used a reference for experimental results, to determine if super-resolution has indeed been attained. The history of the development of the theory of microscope resolution is outlined.

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“…Also shown in Figure 7 is a single measurement for a slit aperture, together with the theoretical variation. Note that for small slit width the signal is given by (Barakat and Houston 1964)…”

Section: Methodsmentioning

confidence: 99%

Signal strength and noise in confocal microscopy: Factors influencing selection of an optimum detector aperture

Sheppard

Cogswell

1991

Scanning

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In confocal microscopy, several factors influence the selection of an optimum size and geometry of detector aperture. These include (1) strength of signal from the specimen, (2) noise level in the system, (3) optical configuration of the microscope (e.g., reflection or fluorescence), (4) time available for signal accumulation, ( 5 ) specimen thickness, and (6) amount of reduction in axial and transverse resolution (from the theoretical maximum) that can be tolerated. It is shown both theoretically and experimentally that the size of the detector aperture critically influences the type and amount of system noise that is detected along with the specimen signal. It is also demonstrated that increasing the size of the detector pinhole does not appreciably increase the signal strength from any single thin plane, but only increases the sampling depth, enhancing brightness at the cost of a reduction in axial resolution. As a result, it is shown that there is no advantage, from the standpoint of signal strength, to using a slit aperture rather than a circular detector pinhole. Finally, it is concluded that all confocal microscopes should be designed to allow the user the capability of selecting an optimum compromise detector aperture setting based on the particular specimen properties, type of microscopy (e.g., fluorescence or reflection) and resolution required.

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Line Spread Function and Cumulative Line Spread Function for Systems with Rotational Symmetry

Cited by 31 publications

References 7 publications

Characterizing digital image acquisition devices

Characterizing digital image acquisition devices

Resolution and super‐resolution

Signal strength and noise in confocal microscopy: Factors influencing selection of an optimum detector aperture

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