Line scale measurement using image registration

Abstract

Abstract. Currently, most advances in dimensional metrology might be seen by the evolution of noncontact measurement (optical measurements), in order to provide traceability for different areas that needs to calibrate microscopes or optical measure machines. In a similar way, the use of image processing techniques for the measuring of objects has been the subject of recent studies in computer vision and image metrology. In the attempt to meet the requirements and demands for high accuracy dimensional metrology with image processing techniques, this work will present the application of the image registration technique for the measurement of line scales. In the conventional calibration, the scales are measured in preestablished points, generally in intervals of 10% of the total scale length. With this application, it becomes possible to provide results for all the scale marks quickly and automatically, whereas in the conventional method it would require more time and, thus, a higher cost for the fulfillment of this measurement.

Measurement Uncertainty Evaluation of the Null Detector Method Using Monte Carlo

“…In quantitative applications, measurements are extracted directly from the images, with national metrology institutes leading research into measurement by image in different areas. The measurements may vary in accuracy from tenth of a millimeter [2] to a couple of nanometers [3,4].…”

Measurement Uncertainty Evaluation of the Null Detector Method Using Monte Carlo

“…The measurements may vary in accuracy from tenth of a millimeter [2] to a couple of nanometers [3,4].…”

Calibration of circular aperture area using vision probe at inmetro

“…Measurement by contact is performed by a Correspondence: pedrobcostarj@gmail.com mechanical probe system, such as coordinate measuring machines. Radiation and vision methods [7][8][9][10][11] are among those for contactless measurement.…”