Limitations of the Linux Fault Injection Framework to Test Direct Memory Access Address Errors

Drebes, Roberto Jung; Nanya, Takashi

doi:10.1109/prdc.2008.44

Cited by 2 publications

(1 citation statement)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This framework [9] can cause memory allocation failures at two levels: in the slab allocator (where it affects kmalloc and most other smallobject allocations) and at the page allocator level (where it affects everything, eventually). There are also hooks to cause occasional disk I/O operations to fail, which should be useful for filesystem developers.…”

Section: Linux Fault Injection Frameworkmentioning

confidence: 99%

Automatic fault injection for driver robustness testing

Cong

Yang

et al. 2015

Proceedings of the 2015 International Symposium on Software Testing and Analysis

View full text Add to dashboard Cite

Robustness testing is a crucial stage in the device driver development cycle. To accelerate driver robustness testing, effective fault scenarios need to be generated and injected without requiring much time and human effort. In this paper, we present a practical approach to automatic runtime generation and injection of fault scenarios for driver robustness testing. We identify target functions that can fail from runtime execution traces, generate effective fault scenarios on these target functions using a bounded trace-based iterative strategy, and inject the generated fault scenarios at runtime to test driver robustness using a permutation-based injection mechanism. We have evaluated our approach on 12 Linux device drivers and found 28 severe bugs. All these bugs have been further validated via manual fault injection. The results demonstrate that our approach is useful and efficient in generating fault scenarios for driver robustness testing with little manual effort.

show abstract

Section: Linux Fault Injection Frameworkmentioning

confidence: 99%

Automatic fault injection for driver robustness testing

Cong

Yang

et al. 2015

Proceedings of the 2015 International Symposium on Software Testing and Analysis

View full text Add to dashboard Cite

show abstract

Post-silicon Functional Validation with Virtual Prototypes

Cong¹

2000

View full text Add to dashboard Cite

Post-silicon validation has become a critical stage in the system-on-chip (SoC) development cycle, driven by increasing design complexity, higher level of integration and decreasing time-to-market. According to recent reports, post-silicon validation effort comprises more than 50% of the overall development effort of an 65nmSoC. Though post-silicon validation covers many aspects ranging from electronic properties of hardware to performance and power consumption of whole systems, a central task remains validating functional correctness of both hardware and its integration with software. There are several key challenges to achieving accelerated and low-cost post-silicon functional validation. First, there is only limited silicon observability and controllability; second, there is no good test coverage estimation over a silicon device; third, it is difficult to generate good post-silicon tests before a silicon device is available; fourth, there is no effective software robustness testing approaches to ensure the quality of hardware/software integration.We propose a systematic approach to accelerating post-silicon functional validation with virtual prototypes. Post-silicon test coverage is estimated in the presilicon stage by evaluating the test cases on the virtual prototypes. Such analysis is first conducted on the initial test suite assembled by the user and subsequently on the expanded test suite which includes test cases that are automatically generated.Based on the coverage statistics of the initial test suite on the virtual prototypes, ii test cases are automatically generated to improve the test coverage. In the postsilicon stage, our approach supports coverage evaluation of test cases on silicon devices to ensure fidelity of early coverage evaluation. The generated test cases are issued to silicon devices to detect inconsistencies between virtual prototypes and silicon devices using conformance checking. We further extend the test case generation framework to generate and inject fault scenario with virtual prototypes for driver robustness testing. Besides virtual prototype-based fault injection, an automatic driver fault injection approach is developed to support runtime fault generation and injection for driver robustness testing. Since virtual prototype enables early driver development, our automatic driver fault injection approach can be applied to driver testing in both pre-silicon and post-silicon stages.For preliminary evaluation, we have applied our coverage evaluation and test generation to several network adapters and their virtual prototypes. We have conducted coverage analysis for a suite of common tests on both the virtual prototypes and silicon devices. The results show that our approach can estimate the test coverage with high fidelity. Based on the coverage estimation, we have employed our automatic test generation approach to generate additional tests. When the generated test cases were issued to both virtual prototypes and silicon devices, we observed significant coverage improvemen...

show abstract

Limitations of the Linux Fault Injection Framework to Test Direct Memory Access Address Errors

Cited by 2 publications

References 8 publications

Automatic fault injection for driver robustness testing

Automatic fault injection for driver robustness testing

Post-silicon Functional Validation with Virtual Prototypes

Contact Info

Product

Resources

About