In this paper we describe a system for interactive picture analysis useful for extraction of various types of physical information from both real-and Fourier-space images. The possibility of hardware and software operations are illustrated, with examples of applications such as analysis of light scattering patterns from phase separated systems, semicrystalline polymer films with significant supermolecular morphology and from less regular polymer systems with a pronounced "speckle effect". The analysis concentrates on both spatial and time dependent scattering processes and measurements of intensity correlation of scattered light. Although the present examples of application are limited to light scattering patterns of polymer systems, the technique of interactive picture analysis is useful for quantitative extraction of information from real-and Fourierspace images of arbitrary structure.