International Conference on Optics and Machine Vision (ICOMV 2024) 2024
DOI: 10.1117/12.3031647
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Light-emitting diode planar array light source system for defect detection of highly reflective surface

Hao Chen,
Hao He,
Jinfan Cai
et al.

Abstract: For defect detection of objects with highly reflective surfaces, the diffuse light source has reflected light interference, which leads to the blurring of the edge of the defect area. In response to the problem that the problem that diffuse light source is difficult to highlight the surface defects of highly reflective objects, an LED planar array light source system is designed. It is composed of four tilted planar light sources, which can produce highly directional and high-brightness striped structured ligh… Show more

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