2019
DOI: 10.1016/j.jallcom.2018.11.161
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Light-controlled resistive switching and voltage-controlled photoresponse characteristics in the Pt/CeO2/Nb:SrTiO3 heterostructure

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Cited by 25 publications
(15 citation statements)
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“…The XPS result indicates the presence of the Ce 3+ and Ce 4+ oxidation states (Figure e), and the ratio is 0.1. Moreover, the XPS result in Figure f confirms that 5.6% oxygen vacancies existed in the CeO 2 film which is attributed to the high temperature during the sputtering process. , A detailed XPS analysis process is shown in Supporting Note 1.…”
Section: Resultsmentioning
confidence: 67%
“…The XPS result indicates the presence of the Ce 3+ and Ce 4+ oxidation states (Figure e), and the ratio is 0.1. Moreover, the XPS result in Figure f confirms that 5.6% oxygen vacancies existed in the CeO 2 film which is attributed to the high temperature during the sputtering process. , A detailed XPS analysis process is shown in Supporting Note 1.…”
Section: Resultsmentioning
confidence: 67%
“…Moreover, the rectifying ratio (I -4V /I +4V ) was enhanced from ∼1 to 8.5 × 10 3 with the insertion of the HAO dielectric layer, indicating that the electrical transport properties might be dominated by the BCZT/HAO/Si interface. 31,32 From the band diagram, it is clear that the high band offsets between HAO and Si will reduce the leakage current in MFIS. Moreover, the absence of oxygen defects in HAO, as shown by XPS, will reduce the leakage current when compared to the structures without HAO.…”
Section: Resultsmentioning
confidence: 99%
“…present a photo‐induced multilevel RRAM based on Pt/CeO 2 /Nb: SrTiO 3 /In, of which structure and I – V behaviors are shown in Figure 13 a . [ 264 ] This device can be transformed among four states under the electric field, including the LRS, Intermediate state1 (IRS1), IRS2, and HRS (Figure 13b ). When the device is exposed to 405 nm light, the HRS increases significantly, while the other states are almost invariant, as shown in Figure 13c .…”
Section: Applications Of Photonic Memristive and Memristive‐like Devicesmentioning
confidence: 99%
“…(a–c) Reproduced with permission. [ 264 ] Copyright 2018, Elsevier B.V. (d–f) Reproduced with permission. [ 258 ] Copyright 2021, Wiley‐VCH.…”
Section: Applications Of Photonic Memristive and Memristive‐like Devicesmentioning
confidence: 99%
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